1. Using electron energy-loss spectroscopy to measure nanoscale electronic and vibrational dynamics in a TEM.
- Author
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Kim, Ye-Jin, Palmer, Levi D., Lee, Wonseok, Heller, Nicholas J., and Cushing, Scott K.
- Subjects
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ELECTRON energy loss spectroscopy , *TRANSMISSION electron microscopes , *ELECTRON diffraction , *IMAGE transmission , *ELECTROMAGNETIC fields - Abstract
Electron energy-loss spectroscopy (EELS) can measure similar information to x-ray, UV–Vis, and IR spectroscopies but with atomic resolution and increased scattering cross-sections. Recent advances in electron monochromators have expanded EELS capabilities from chemical identification to the realms of synchrotron-level core-loss measurements and to low-loss, 10–100 meV excitations, such as phonons, excitons, and valence structures. EELS measurements are easily correlated with electron diffraction and atomic-scale real-space imaging in a transmission electron microscope (TEM) to provide detailed local pictures of quasiparticle and bonding states. This perspective provides an overview of existing high-resolution EELS (HR-EELS) capabilities while also motivating the powerful next step in the field—ultrafast EELS in a TEM. Ultrafast EELS aims to combine atomic-level, element-specific, and correlated temporal measurements to better understand spatially specific excited-state phenomena. Ultrafast EELS measurements also add to the abilities of steady-state HR-EELS by being able to image the electromagnetic field and use electrons to excite photon-forbidden and momentum-specific transitions. We discuss the technical challenges ultrafast HR-EELS currently faces, as well as how integration with in situ and cryo measurements could expand the technique to new systems of interest, especially molecular and biological samples. [ABSTRACT FROM AUTHOR]
- Published
- 2023
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