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Presents information pertaining to the structural and optical characterization of CdSe thin films which were deposited by the laser ablation technique on silicon. How the photoluminescence spectra of CdSe films were measured; Ascertaining of the parameters related to the electron-phonon interaction; What the evaluated fitting parameters have shown.

The memory-like behavior of melanin biopolymer under electrical stimuli is shown through electrical transport characterization performed on melanin based metal insulator semiconductor structures on silicon. The presence of a memory window and retention behavior is verified by capacitance-voltage read outs before and after the application of voltage pulses. Interestingly, these phenomena occur without the presence of metallic nanoclusters enclosed in the melanin matrix. Charge trapping is considered the main mechanism responsible for the melanin memory-like character. The inability to erase the memory window has been ascribed to the permanent polarization effect during the application of the voltage pulse. [ABSTRACT FROM AUTHOR]

The effect of laser light interaction with alumina surface of a single filament coplanar dielectric barrier discharge has been investigated. It has been found that for laser photon energy lower than the pure alumina photoelectron emission threshold, the laser beam was effective in triggering single streamer discharge below regular ignition voltage threshold. This work demonstrates that triggering of the filamentary discharge occurs due to the laser induced extraction of electrons originally trapped by the plasma radiation at the dielectric surface; the trap energy levels lower than the dielectric band gap explain the easier electron detrapping due to incident laser photons. [ABSTRACT FROM AUTHOR]

The plasma of a dielectric barrier discharge can fill traps in the alumina that cover the electrode. Trap energies and lifetimes are estimated by thermoluminescence and optically stimulated luminescence. Comparison with similar results for traps created by other radiation sources clarifies the mechanisms regulating this effect. Alumina’s trap energies are approximately 1 eV, and the traps remain active for several days after plasma exposure. These results could be important to keep dielectric barrier discharge plasmas uniform since a trapped charge can be an electron reservoir. [ABSTRACT FROM AUTHOR]