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Structural properties and photoluminescence study of CdSe/Si epilayers deposited by laser ablation.
- Source :
- Journal of Applied Physics; 3/15/1998, Vol. 83 Issue 6, p3337, 8p, 1 Chart, 10 Graphs
- Publication Year :
- 1998
-
Abstract
- Presents information pertaining to the structural and optical characterization of CdSe thin films which were deposited by the laser ablation technique on silicon. How the photoluminescence spectra of CdSe films were measured; Ascertaining of the parameters related to the electron-phonon interaction; What the evaluated fitting parameters have shown.
- Subjects :
- PHYSICS
THIN films
LASER ablation
SILICON
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 83
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 388743
- Full Text :
- https://doi.org/10.1063/1.367102