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Structural properties and photoluminescence study of CdSe/Si epilayers deposited by laser ablation.

Authors :
Perna, G.
Capozzi, V.
Ambrico, M.
Source :
Journal of Applied Physics; 3/15/1998, Vol. 83 Issue 6, p3337, 8p, 1 Chart, 10 Graphs
Publication Year :
1998

Abstract

Presents information pertaining to the structural and optical characterization of CdSe thin films which were deposited by the laser ablation technique on silicon. How the photoluminescence spectra of CdSe films were measured; Ascertaining of the parameters related to the electron-phonon interaction; What the evaluated fitting parameters have shown.

Details

Language :
English
ISSN :
00218979
Volume :
83
Issue :
6
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
388743
Full Text :
https://doi.org/10.1063/1.367102