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This paper addresses fault pattern diagnosis of discrete event systems, involving fault pattern detection and diagnosability. A fault pattern is modelled as a finite automaton whose accepted language is the objective to be diagnosed, representing the occurrence of complex or composite faults. A verifier for fault pattern detection based on the synchronous product of a system and a fault pattern is proposed. By removing all silent events, a silent closure is calculated based on the synchronous product, which offers computational advantages for systems that have a large number of silent events. An NSC/FSC pair verifier is then computed by taking the product of a normal silent closure and an accepted silent closure. By studying indeterminate cycles of the NSC/FSC pair verifier, necessary and sufficient verification conditions are established, asserting that a system is diagnosable with respect to a fault pattern if and only if there is no indeterminate cycle in the NSC/FSC pair verifier. It is shown that the proposed method requires polynomial time at most. Finally, a case study to illustrate the results is provided. [ABSTRACT FROM AUTHOR]

Venkatachala on the one hand, and Avdispahić & Zejnulahi on the other, both studied integer sequences with an unusual sum property defined in a greedy way, and proved many results about them. However, their proofs were rather lengthy and required numerous cases. In this paper, I provide a different approach, via finite automata, that can prove the same results (and more) in a simple, unified way. Instead of case analysis, we use a decision procedure implemented in the free software Walnut. Using these ideas, we can prove a conjecture of Quet and find connections between Quet's sequence and the "married" functions of Hofstadter. • Uses a new technique, automata theory, to prove properties of some greedily-defined integer sequences. • Finds much simpler proofs of some known results in the literature. • Finds a new connection between Quet's sequence and the Hofstadter married functions. [ABSTRACT FROM AUTHOR]