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Silent closure based pair verifier for fault pattern diagnosis of discrete event systems.

Authors :
Liang, Ye
Lefebvre, Dimitri
Li, Zhiwu
Source :
IET Control Theory & Applications (Wiley-Blackwell). Mar2024, Vol. 18 Issue 5, p603-613. 11p.
Publication Year :
2024

Abstract

This paper addresses fault pattern diagnosis of discrete event systems, involving fault pattern detection and diagnosability. A fault pattern is modelled as a finite automaton whose accepted language is the objective to be diagnosed, representing the occurrence of complex or composite faults. A verifier for fault pattern detection based on the synchronous product of a system and a fault pattern is proposed. By removing all silent events, a silent closure is calculated based on the synchronous product, which offers computational advantages for systems that have a large number of silent events. An NSC/FSC pair verifier is then computed by taking the product of a normal silent closure and an accepted silent closure. By studying indeterminate cycles of the NSC/FSC pair verifier, necessary and sufficient verification conditions are established, asserting that a system is diagnosable with respect to a fault pattern if and only if there is no indeterminate cycle in the NSC/FSC pair verifier. It is shown that the proposed method requires polynomial time at most. Finally, a case study to illustrate the results is provided. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
17518644
Volume :
18
Issue :
5
Database :
Academic Search Index
Journal :
IET Control Theory & Applications (Wiley-Blackwell)
Publication Type :
Academic Journal
Accession number :
175964431
Full Text :
https://doi.org/10.1049/cth2.12593