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Your search keyword '"SCANNING electron microscopes"' showing total 27 results

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Start Over You searched for: Descriptor "SCANNING electron microscopes" Remove constraint Descriptor: "SCANNING electron microscopes" Search Limiters Peer Reviewed Remove constraint Search Limiters: Peer Reviewed Topic particles (nuclear physics) Remove constraint Topic: particles (nuclear physics) Publication Year Range Last 50 years Remove constraint Publication Year Range: Last 50 years Publisher american institute of physics Remove constraint Publisher: american institute of physics
27 results on '"SCANNING electron microscopes"'

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1. In situ X-ray reflectivity of indium supplied on GaN templates by metal organic vapor phase epitaxy.

2. Nanoscale surface modifications and formation of conical structures at aluminum surface induced by single shot exposure of soft x-ray laser pulse.

3. Polarization relaxation mechanism of Ba0.6Sr0.4TiO3/Ni0.8Zn0.2Fe2O4 composite with giant dielectric constant and high permeability.

4. Mechanical behavior of a Zr-based metallic glass at elevated temperature under high strain rate.

5. A comparison of ion transport in different polyethylene oxide–lithium salt composite electrolytes.

6. Temperature dependence of electric and dielectric behaviors of Ni/polyvinylidene fluoride composites.

7. Structural and particulate to bulk phase transformation of CdS film on annealing: A Raman spectroscopy study.

8. Variation in electrical resistance versus strain of an individual multiwalled carbon nanotube.

9. Study of ferroelectric properties in sodium nitrite:poly(vinyl alcohol) nanocomposite films.

10. Cathodoluminescence study of single zinc oxide nanopillars with high spatial and spectral resolution.

11. Aggregation-governed oriented growth of inorganic crystals at an organic template.

12. Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method.

13. Low-temperature copper-induced lateral growth of polycrystalline germanium assisted by external compressive stress.

14. Fabrication and morphology of porous p-type SiC.

15. Correlation of strain, wing tilt, dislocation density, and photoluminescence in epitaxial lateral overgrown GaN on SiC substrates.

16. Growth and characterization of nonpolar, heavily Mn-substituted ZnO films.

17. C-V measurements of micron diameter metal-oxide-semiconductor capacitors using a scanning-electron-microscope-based nanoprobe.

18. High brightness picosecond electron gun.

19. Ultrahigh vacuum scanning electron microscope system combined with wide-movable scanning tunneling microscope.

20. Frost formation and ice adhesion on superhydrophobic surfaces.

21. Measuring the electrical characteristics of individual junctions in the SnO2 capped ZnO nanowire arrays on Zn substrate.

22. Development of probe-to-probe approach method for an independently controlled dual-probe scanning tunneling microscope.

23. Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC.

24. In situ study of the growth of ZnO nanosheets using environmental scanning electron microscope.

25. Large-scale synthesis and optical behaviors of ZnO tetrapods.

26. Influence of the electron beam on electromigration measurements within a scanning electron microscope.

27. Charging process of polyurethane based composites under electronic irradiation: Effects of cellulose fiber content.

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