Measuring the electrical characteristics of individual junctions in the SnO2 capped ZnO nanowire arrays on Zn substrate.

Direct measurements on electrical characteristics have been carried out in situ inside a scanning electron microscope using a multiple nanoprobe system on individual SnO2 capped ZnO nanowires (NWs) within a NW film on a Zn substrate. It is shown that while good Ohmic contacts can be made at Zn–ZnO NW and ZnO NW–SnO2 cap (when heavily doped with Zn) junctions, the overall I-V characteristics of the Zn–ZnO–SnO2 junction system differ significantly among different NWs, suggesting doping inhomogeneity in the NW film. [ABSTRACT FROM AUTHOR]