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In 2016, we published a method for processing dual-energy computed tomography (DECT) data called system-independent rho-e/Z-e ( $\rho _{\mathrm {e}}/Z_{\mathrm {e}}$ ) or SIRZ. Using data from multiple DECT systems and spectra, SIRZ estimated the electron density $\rho _{\mathrm {e}}$ and effective atomic number $Z_{\mathrm {e}}$ (based on published X-ray cross sections), for a set of known specimens. However, the decomposition process required complex spectral modeling of the DECT system, which made SIRZ difficult to implement and automate. This paper describes the subsequent work on “SIRZ-2” to simplify the spectral modeling, automate the process, and improve its range and versatility. The SIRZ-2 basis functions are more accurate for the X-ray energy range ( $Z_{\mathrm {e}}$ of 6–20) were scanned with multiple spectral pairs (up to 200 keV) on seven different DECT systems, including a commercial airport luggage scanner. For these varied tests, the average SIRZ-2 relative errors for $\rho _{\mathrm {e}}$ estimates were four times lower (0.7% compared to 3.0% for SIRZ), while average $Z_{\mathrm {e}}$ relative errors were comparably low for both methods ( $\rho _{\mathrm {e}}$ , $Z_{\mathrm {e}}$ ) that can be directly compared across DECT systems and over time.

In this paper, based on an invited talk at SORMA (May 2016), we present an overview of x-ray sources, detectors and system configurations for non-intrusive inspection (NII) of cargo containers. Our emphasis is on dual-energy x-ray NII for detecting high-atomic-number ( $\text {Z}\geq 72$ ) materials such as tungsten shielding and special nuclear materials (SNM). Standard single-energy (MeV and above) x-rays needed to penetrate and image cargo provide little SNM contrast, whereas dual-energy x-ray NII is demonstrated as a way to improve the selectivity of materials with Z $\text {Z}\geq 72$ . For two possible dual-energy x-ray source technologies—polyenergetic dual-energy (PDE) and quasi-monoenergetic x-ray sources (QMXS)—we investigate their trade-offs and future prospects using experimental and simulated results. The reduced scatter and larger separation of low- and high-energy photons provided by QMXS offers improved high-Z material contrast, but practical considerations such as flux and pulse rate need to be solved before making a deployable system. Straight-ray simulations show factor of four increases in contrast for QMXS over PDE scans of tin (Z=50) and iron (Z=26) relative to a uranium plate (Z=92) behind 20 cm of iron simulated cargo.

We present a new decomposition approach for dual-energy computed tomography (DECT) called SIRZ that provides precise and accurate material description, independent of the scanner, over diagnostic energy ranges (30 to 200 keV). System independence is achieved by explicitly including a scanner-specific spectral description in the decomposition method, and a new X-ray-relevant feature space. The feature space consists of electron density, ${\rho _{\rm e}}$ , and a new effective atomic number, ${{\rm Z}_{\rm e}}$ , which is based on published X-ray cross sections. Reference materials are used in conjunction with the system spectral response so that additional beam-hardening correction is not necessary. The technique is tested against other methods on DECT data of known specimens scanned by diverse spectra and systems. Uncertainties in accuracy and precision are less than 3% and 2% respectively for the ( ${\rho _{\rm e}}$ , ${{\rm Z}_{\rm e}}$ ) results compared to prior methods that are inaccurate and imprecise (over 9%).

Recent advances in cadmium telluride (CdTe) energy-discriminating pixelated detectors have enabled the possibility of Multi-Spectral X-ray Computed Tomography (MSXCT) to incorporate spectroscopic information into CT. MultiX ME 100 V2 is a CdTe-based spectroscopic x-ray detector array capable of recording energies from 20 to 160 keV in 1.1 keV energy bin increments. Hardware and software have been designed to perform radiographic and computed tomography tasks with this spectroscopic detector. Energy calibration is examined using the end-point energy of a bremsstrahlung spectrum and radioisotope spectral lines. When measuring the spectrum from Am-241 across 500 detector elements, the standard deviation of the peak-location and FWHM measurements are ± 0.4 and ± 0.6 keV, respectively. As these values are within the energy bin size (1.1 keV), detector elements are consistent with each other. The count rate is characterized, using a nonparalyzable model with a dead time of 64 ± 5 ns. This is consistent with the manufacturer’s quoted per detector-element linear-deviation at 2 Mpps (million photons per sec) of 8.9 % (typical) and 12 % (max). When comparing measured and simulated spectra, a low-energy tail is visible in the measured data due to the spectral response of the detector. If no valid photon detections are expected in the low-energy tail, then a background subtraction may be applied to allow for a possible first-order correction. If photons are expected in the low-energy tail, a detailed model must be implemented. A radiograph of an aluminum step wedge with a maximum height of 20 mm shows an underestimation of attenuation by about 10 % at 60 keV. This error is due to partial energy deposition from higher energy (>60 keV) photons into a lower-energy (∼60 keV) bin, reducing the apparent attenuation. A radiograph of a polytetrafluoroethylene (PTFE) cylinder taken using a bremsstrahlung spectrum from an x-ray voltage of 100 kV filtered by 1.3 mm Cu is reconstructed using Abel inversion. As no counts are expected in the low energy tail, a first order background correction is applied to the spectrum. The measured linear attenuation coefficient (LAC) is within 10% of the expected value in the 60 to 100 keV range. Below 60 keV, low counts in the corrected spectrum and partial energy deposition from incident photons of energy greater than 60 keV into energy bins below 60 keV impact the LAC measurements. This report ends with a demonstration of the tomographic capability of the system. The quantitative understanding of the detector developed in this report will enable further study in evaluating the system for characterization of an object’s chemical make-up for industrial and security purposes.

In a recent journal article [IEEE Trans. Nuc. Sci., 63(1), 341-350, 2016], we introduced a novel method that decomposes dual-energy X-ray CT (DECT) data into electron density (ρe) and a new effective-atomic-number called Ze in pursuit of system-independent characterization of materials. The Ze of a material, unlike the traditional Zeff, is defined relative to the actual X-ray absorption properties of the constituent atoms in the material, which are based on published X-ray cross sections. Our DECT method, called SIRZ (System-Independent ρe, Ze), uses a set of well-known reference materials and an understanding of the system spectral response to produce accurate and precise estimates of the X-ray-relevant basis variables (ρe, Ze) regardless of scanner or spectra in diagnostic energy ranges (30 to 200 keV). Potentially, SIRZ can account for and correct spectral changes in a scanner over time and, because the system spectral response is included in the technique, additional beam-hardening correction is not needed. Results show accuracy (