CT dual-energy decomposition into x-ray signatures ρeand Ze

In a recent journal article [IEEE Trans. Nuc. Sci., 63(1), 341-350, 2016], we introduced a novel method that decomposes dual-energy X-ray CT (DECT) data into electron density (ρe) and a new effective-atomic-number called Ze in pursuit of system-independent characterization of materials. The Ze of a material, unlike the traditional Zeff, is defined relative to the actual X-ray absorption properties of the constituent atoms in the material, which are based on published X-ray cross sections. Our DECT method, called SIRZ (System-Independent ρe, Ze), uses a set of well-known reference materials and an understanding of the system spectral response to produce accurate and precise estimates of the X-ray-relevant basis variables (ρe, Ze) regardless of scanner or spectra in diagnostic energy ranges (30 to 200 keV). Potentially, SIRZ can account for and correct spectral changes in a scanner over time and, because the system spectral response is included in the technique, additional beam-hardening correction is not needed. Results show accuracy (