1. Amplitude modulation atomic force microscopy based on higher flexural modes.
- Author
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Xilong Zhou, Rongshu Zhuo, Pengfei Wen, and Faxin Li
- Subjects
- *
AMPLITUDE modulation , *ATOMIC force microscopy , *ELASTIC modulus , *VISCOSITY - Abstract
In this work, amplitude modulation atomic force microscopy (AM-AFM) based on the higher flexural modes of the microcantilever is investigated by a numerical approach. The amplitude-distance and phase-distance curves for the first four flexural modes are obtained and compared. The dependence of phase on elastic modulus and viscosity of the sample is analyzed. Results show that a higher flexural mode yields a larger amplitude and phase in the repulsive regime and reduces the bistability, but causes a larger sample deformation and peak repulsive force. Compared to that of a lower flexural mode, the phase of a higher flexural mode provides higher sensitivity to viscosity variation for relatively large moduli. [ABSTRACT FROM AUTHOR]
- Published
- 2017
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