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In this article, we explore the possibility of using spread spectrum time domain reflectometry (SSTDR) for detecting disconnections in a large-scale photovoltaic (PV) array. We discuss the importance, role, and trade-offs of SSTDR resolution, frequency, and attenuation in detecting disconnects in the system. Our results show that if the proper system parameters are chosen, disconnections can be detected in a 1-kV system consisting of twenty-six 60-cell PV panels and located within 1.52 m for the first 22 modules.

Spread spectrum time domain reflectometry (SSTDR) is a non-intrusive method for electrical fault detection and localization that enables continuous monitoring of live electrical systems. Electrical faults create changes in impedance that create subsequent changes in the SSTDR reflection response. These changes in reflection response can be detected only if the changes are outside the window of uncertainty of the SSTDR measurement. In this paper, we establish a method of determining this window of uncertainty and the associated minimum-detectable change in impedance for SSTDR measurements. We demonstrate this for a photovoltaic (PV) systems, although the methods could be similarly applied to other applications. We assess the variability in SSTDR measurements caused by changes in the PV system that are representative of normal maintenance actions such as disconnecting/reconnecting a connector and completely breaking-down/setting-up the entire system. We evaluate how this variability translates to a minimum-detectable change in impedance and how that relates to common faults in PV systems (arc and ground faults, shading, damaged cells, and aging). We also describe methods of increasing SSTDR fidelity to accurately extract minor changes in impedance and therefore, detect small-magnitude electrical faults.

In this paper, we present a method for estimating complex impedances using reflectometry and a modified steepest descent inversion algorithm. We simulate spread spectrum time domain reflectometry (SSTDR), which can measure complex impedances on energized systems for an experimental setup with resistive and capacitive loads. A parametric function, which includes both a misfit function and stabilizer function, is created. The misfit function is a least squares estimate of how close the model data matches observed data. The stabilizer function prevents the steepest descent algorithm from becoming unstable and diverging. Steepest descent iteratively identifies the model parameters that minimize the parametric function. We validate the algorithm by correctly identifying the model parameters (capacitance and resistance) associated with simulated SSTDR data, with added 3 dB white Gaussian noise. With the stabilizer function, the steepest descent algorithm estimates of the model parameters are bounded within a specified range. The errors for capacitance (220pF to 820pF) and resistance (50 Ω to 270 Ω) are < 10%, corresponding to a complex impedance magnitude |R +1/jωC| of 53 Ω to 510 Ω.

In this work, the optical properties of thin-film α-Ga2O3 are examined and contrasted with those of β-Ga2O3 thin films grown on similar substrates. Thin films of α-Ga2O3 were synthesized employing mist chemical vapor deposition (mist CVD) on double-side polished c-plane sapphire. Optical properties were studied through absorbance, photoluminescence (PL), and photoluminescence excitation (PLE). Absorbance measurements showed spectra consistent with that previously reported in the literature, with Eg ~ 5.19 eV for α-Ga2O3. Despite an absorption edge laying at higher energies, the PL spectra in α-Ga2O3 films yield similar features to those of metal-organic chemical vapor deposition (MOCVD) grown β-Ga2O3 thin-films. In both cases, when excited above the band gap, the PL spectra consist of UV, UV′, blue and green broad bands. As the excitation photon energy was varied, the relative intensity of these PL bands changed. This is attributed to a non-uniform defect concentration distribution across the sample depth. With smaller concentration of defects associated with blue and green emission in the bulk compared to the surface in the α-phase films.

This article explains the use of supervised and unsupervised dictionary learning approaches on spread spectrum time domain (SSTDR) data to detect and locate disconnections in a PV array consisting of five panels. The aim is to decompose an SSTDR reflection signature into different components where each component has a physical interpretation, such as noise, environmental effects, and faults. In the unsupervised dictionary learning approach, the decomposed components are inspected to detect and localize faults. The maximum difference between actual and predicted location of the fault is 0.44 m on a system with five panels connected to an SSTDR box with a leader cable of 59.13 m and total length of 67.36 m including the effective length of the panels. In the supervised dictionary learning approach, the dictionary components are used to classify the SSTDR data to their respective fault types. Our results show a 97% accuracy using the supervised learning approach.

Spread spectrum time domain reflectometry (SSTDR) has been traditionally used to detect hard faults (open and short circuit faults) in transmission lines. Prior work has focused on loads at the end of the line with little research on impedances from circuit elements located in the middle of the line (i.e., not at the load) or on only one wire of the line. In this work we consider cases of transmission lines with different impedances on each wire. We refer to lines with the same impedance on both wires (positive and negative) as symmetric. Lines with different impedances on each wire are asymmetric. For highly localized impedances (approximately infinitesimal in length, i.e. with a length significantly smaller than the wavelength of the incident signal), the reflections and their effects on the propagating wave become difficult to describe with traditional transmission line theory. We provide analytical expressions for reflection coefficients for symmetric and asymmetric transmission lines and show that these formulae describe experimental measurements of capacitors and resistors to about 99% accuracy for the magnitudes and 75% for the phases.

The operating efficiency of photovoltaic (PV) plants can be improved if damaged or degraded modules can be detected and identified. Currently, string-level power electronics can detect problems with modules or cabling but not locate them, which would facilitate addressing these issues. Here, we investigate the ability of spread spectrum time domain reflectometry (SSTDR) to both detect and locate/identify damaged cells and modules within a series-connected PV string. We tested the ability of SSTDR to detect and locate single-cell mini-modules and full-sized PV modules, which were intentionally damaged by impacts with a hammer (breaking the glass and damaging the silicon below) or by cutting through some or all busbars. Damage to the glass and silicon of cells was detected and located within a small string of minimodules. Busbar damage was detectable only if an open was created by cutting through all intercell busbars. Physical impact damage to the glass and silicon of a full-sized PV module could be detected, but further development of signal processing is needed to achieve localization of such damaged modules within a string.

Thermoelectrics (TEs) are an important class of technology that harvest electric power directly from heat sources. When designing both high performance and environmentally friendly TE materials, the pseudo-cubic structure has great theoretical potential to maximize the dimensionless figure of merit ZT. The TE multinary single crystal with a pseudo-cubic structure paves a new path toward manipulating valley degeneracy and anisotropy with low thermal conductivity caused by short-range lattice distortion. Here, we report a record high ZT = 1.6 around 800 K realized in a totally environmentally benign p-type Na-doped Cu2ZnSnS4 (CZTS) single crystal. The exceptional performance comes from a high power factor while maintaining intrinsically low thermal conductivity. The combination of the pseudo-cubic structure and intrinsic properties of the CZTS single crystal takes advantage of simple material tuning without complex techniques.

In this paper, we present a method for estimating capacitances with SSTDR and a dictionary matching algorithm. We simulate a dictionary of simulated SSTDR reflections for a range of capacitances, based on parameters of the transmitted SSTDR signal, the SSTDR signal generator, and the transmission line. The measured SSTDR reflection data is compared with each simulated reflection through cross-correlation, and the estimated capacitance is found from the highest correlation. We validate this method with experiments on capacitors ranging from 1pF to 450pF using a 12 MHz SSTDR. The dictionary matching algorithm estimated the capacitor values within 4% to 20% in the capacitance range of 100pF to 400pF.

The photovoltaic performance of CdTe solar cells is mainly limited by low doping and short minority carrier lifetime. Group-V element doping and Se-alloying have a significant impact on tuning these fundamental CdTe properties. In this paper, we report the growth of p-type As-doped, Cd-rich CdTe1−xSex single crystals using metallic Cd as the solvent in the traveling-heater method. The structural and electrical properties of CdTe1−xSex are examined for different Se concentrations. CdTe1−xSex single crystals (0 ≤ x ≤ 0.5) with zincblende structure indicate homogeneous composition. The 1017 cm−3 As-doping activation efficiency can be maintained at close to 50% for x ≤ 0.2. Se alloying leads to bulk minority carrier lifetime exceeding 30 ns for samples doped near 1017 cm−3. These results help us to overcome the current roadblocks in device performance.

Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.

In this work, a systematic photoluminescence (PL) study on three series of gallium oxide/aluminum gallium oxide films and bulk single crystals is performed including comparing doping, epitaxial substrates, and aluminum concentration. It is observed that blue/green emission intensity strongly correlates with extended structural defects rather than the point defects frequently assumed. Bulk crystals or Si-doped films homoepitaxially grown on (010) β-Ga2O3 yield an intense dominant UV emission, while samples with extended structural defects, such as gallium oxide films grown on either (-201) β-Ga2O3 or sapphire, as well as thick aluminum gallium oxide films grown on either (010) β-Ga2O3 or sapphire, all show a very broad PL spectrum with intense dominant blue/green emission. PL differences between samples and the possible causes of these differences are analyzed. This work expands previous reports that have so far attributed blue and green emissions to point defects and shows that in the case of thin films, extended defects might have a prominent role in emission properties.

We report a new type of structural defect in β-Ga2O3 homoepitaxial thin films grown by metalorganic vapor phase epitaxy, which we have dubbed as “sympetalous defects.” These consist of a line defect (for example, a nanotube defect) in the underlying substrate combined with a multi-faceted inverted polycrystalline pyramid in the epitaxial film, which may also be decorated with twinned polycrystalline grains. In plan-view atomic force, scanning electron, or optical microscopies, the sympetalous defects appear similar in shape to polygonal etch pits observed for single crystals. Photoluminescence microscopy exposed spots of polarization-dependent luminescence at these defects, different from the single crystal films' luminescence. Furthermore, some of the defects exhibited circular dichroism in their luminescence that we correlated with partial helices formed within the pits by the arrangement of linearly dichroic polycrystalline grains. Finally, the density of sympetalous defects agrees with the etch pit densities of the substrates. Understanding and controlling these defects will be of importance as they modify the local properties of films, affect fabricated device yields, and influence characterization experiments.

Spread spectrum time domain reflectometry (SSTDR) has proven to be effective in the detection and localization of intermittent faults on live electrical wiring. The location, shape, and magnitude of the peaks from the SSTDR signal give information about the location and type of wiring fault. To locate these faults, baseline subtraction is typically used. Unfortunately, varying weather conditions alter the SSTDR signal significantly and make baseline subtraction methods unreliable. Specifically, moisture from rain changes the relative permittivity of the cable and consequently leads to a change in the velocity of propagation (VOP) of the SSTDR signal. This change of VOP stretches the SSTDR signal and therefore shifts the peaks out of place, leading to inaccurate fault localization. Figure 1 (below) shows the described stretching effect rain has on SSTDR signals.

Recent advances in design and processing technology have made possible commercialization of polycrystalline (px)-CdTe as a photovoltaic absorber. Grain boundaries (GBs) are the most prominent struc...

This article describes the novel use of spread-spectrum time-domain reflectometry (SSTDR) for detecting and locating disconnection faults in photovoltaic (PV) power plants. We measure strings of cells and full-sized modules to understand how disconnections affect the reflectometry signature. PV modules correspond to reactive loads and disconnections in a PV string and cause distinguishable and measurable changes in SSTDR responses. Disconnection faults are manually introduced and correctly identified and localized applying the proposed technique. The SSTDR technique can detect and locate disconnects through at least eight 36-cell modules. Using the new technique described in this article, we can both detect and locate the disconnections within a 1-ft resolution, on average.

Ultra-fast thermal annealing of semiconductor materials using a laser can be revolutionary for short processing times and low manufacturing costs. Here we investigate Cu–In–Se thin films as precursors for CuInSe2 semiconductor absorber layers via laser annealing. The reaction mechanism of laser annealed metal stacks is revealed by measuring ex situ X-ray diffractograms, Raman spectra and composition. It is shown that the formation of CuInSe2 occurs via the formation of CuxSe/InxSey binary phases as in conventional annealing routes, despite the entirely different annealing time scale. Pre-alloying the Cu and In metals prior to laser annealing significantly enhances the selenisation reaction rate. Laser annealing for six seconds approaches a near phase-pure material, which exhibits similar crystalline quality to the reference material annealed for ninety minutes in a tube furnace. The estimated quasi Fermi level splitting deficit for the laser annealed material is only 60 meV lower than the reference sample, which implies a high optoelectronic quality.

Reflectometry, which is commonly used for locating faults on electrical wires, produces sampled time domain signatures with peaks that are often missed due to this sampling. Resultant errors in these sampled peaks translate to errors in calculating the impedance and location of the fault. Typical signal processing methods to improve the accuracy of these sampled peaks have complexity on the order of O(N2). For embedded fault location applications, algorithms with lower complexity are desired. In this article, we introduce three algorithms for improving the accuracy of the peak with a complexity of O(N). We evaluate these algorithms on the practical case of calculating the velocity of propagation and the characteristic impedance of a photovoltaic (PV) cable using spread spectrum time-domain reflectometry.

Three-dimensional (3D) semimetals have been predicted and demonstrated to have a wide variety of interesting properties associated with their linear energy dispersion. In analogy to two-dimensional (2D) Dirac semimetals, such as graphene, Cd3As2 has shown ultrahigh mobility and large Fermi velocity and has been hypothesized to support plasmons at terahertz frequencies. In this work, we experimentally demonstrate synthesis of high-quality large-area Cd3As2 thin films through thermal evaporation as well as the experimental realization of plasmonic structures consisting of periodic arrays of Cd3As2 stripes. These arrays exhibit sharp resonances at terahertz frequencies with associated quality factors ( Q) as high as ∼3.7 (at 0.82 THz). Such spectrally narrow resonances can be understood on the basis of a long momentum scattering time, which in our films can approach ∼1 ps at room temperature. Moreover, we demonstrate an ultrafast tunable response through excitation of photoinduced carriers in optical pump/terahertz probe experiments. Our results evidence that the intrinsic 3D nature of Cd3As2 might provide for a very robust platform for terahertz plasmonic applications. Moreover, the long momentum scattering time as well as large kinetic inductance in Cd3As2 also holds enormous potential for the redesign of passive elements such as inductors and hence can have a profound impact in the field of RF integrated circuits.

We present a framework for analyzing electromagnetic signal propagation through piecewise-defined transmission lines with arbitrary, series-connected impedances. While the formulation is general and scalable, we apply it here to propagation through a photovoltaic module with cables on either side acting, with a home run cable, as a section of an inhomogeneous transmission line. Understanding propagation through this unit of a series-connected string of photovoltaic modules is necessary to enable the use of time-domain reflectometry techniques for monitoring the status of individual components in series-connected strings within large photovoltaic arrays.

Herein we utilize polarized photoluminescence (PL) microscopy and spectral analysis to locate and characterize many different types of µm-scale extended defects present in melt-grown bulk crystals and metal-organic vapor-phase epitaxy (MOVPE)-grown epitaxial thin films of β-Ga2O3 and β-(Al,Ga)2O3. These include pits, divots, mounds, scratches, rotation domain boundaries, stacking faults, cracks, and other defect categories. Some types of µm-scale defects simply decrease overall PL yield, while others emit different spectra than single crystal regions. We combine PL microscopy with atomic force microscopy (AFM) and scanning electron microscopy (SEM) to provide detailed characteristics of these different types of features which can arise from both bulk crystal growth, surface preparation, and epitaxial growth processes. We show that sample quality (in terms of extended defects) can be determined by using PL and that attributing spectral features to isolated point defects is invalid unless the sample is proven to not contain extended defects.

We report on the anisotropy of the terahertz permittivity of β-Ga 2 O 3 through terahertz transmission measurements in single crystals of (010) and (-201) orientation. The electromagnetic wave propagation in this anisotropic crystal is best described with an orthogonal set of eigenmodes, i.e., polarization eigenvectors, wherein each eigenmode possess a distinct refractive index. Polarization-dependent transmission measurements were carried out to ascertain the nature of the eigenmodes and their directions with respect to the crystal axes.

Performing deep level transient spectroscopy (DLTS) on Schottky diodes, we investigated defect levels below the conduction band minima (Ec) in Czochralski (CZ) grown unintentionally-doped (UID) and vertical gradient freeze (VGF)-grown Zr-doped beta-Ga2O3 crystals. In UID crystals with an electron concentration of 10^17 cm-3, we observe levels at 0.18 eV and 0.46 eV in addition to the previously reported 0.86 (E2) and 1.03 eV (E3) levels. For 10^18 cm-3 Zr-doped Ga2O3, signatures at 0.30 eV (E15) and 0.71 eV (E16) are present. For the highest Zr doping of 5*10^18 cm-3, we observe only one signature at 0.59 eV. Electric field-enhanced emission rates are demonstrated via increasing the reverse bias during measurement. The 0.86 eV signature in the UID sample displays phonon-assisted tunneling enhanced thermal emission and is consistent with the widely reported E2 (FeGa) defect. The 0.71 eV (E16) signature in the lower-Zr-doped crystal also exhibits phonon-assisted tunneling emission enhancement. Taking into account that the high doping in the Zr-doped diodes also increases the electric field, we propose that the 0.59 eV signature in the highest Zr-doped sample likely corresponds to the 0.71 eV signature in lower-doped samples. Our analysis highlights the importance of testing for and reporting on field-enhanced emission especially the electric field present during DLTS and other characterization experiments on beta-Ga2O3 along with the standard emission energy, cross-section, and lambda-corrected trap density. This is important because of the intended use of beta-Ga2O3 in high-field devices and the many orders of magnitude of possible doping., 18 pages, 3 figures

Exfoliated gallium oxide (Ga2O3) has been reported as an ultrathin channel material in field-effect transistors. Unlike in 2D materials with van der Waals forces between stacked layers, weak bonding in β-Ga2O3 along the (100) direction enables mechanical exfoliation. The thickness of these exfoliated films has been limited to tens to hundreds of nanometers. Here we summarize our latest work, which followed the process developed by Carey et al., enabling us to attain ~2 nm thick Ga2O3 films over a large surface area (< 1 mm2). The films are characterized using optical microscopy, AFM, XPS, Raman spectroscopy, photoluminescence (PL), and TEM. Optical microscope images showed color changes to the film upon annealing. AFM revealed the film thickness to be as thin as 2 nm over areas << 1 mm2. XPS and Raman spectra revealed characteristic signatures of β-phase Ga2O3. Characteristic PL of Ga2O3 was seen in all samples with overall intensity of luminescence increasing after annealing, attributed to increased crystallinity and grain size. Changes in PL after annealing are associated with an increase in oxygen interstitials and a decrease in oxygen vacancies. Lastly, TEM analysis revealed the film as β-phase Ga2O3 polycrystalline. Overall, our results demonstrate that annealing of thin films obtained from oxide printing of liquid metal Ga is a non-expensive and straightforward process that can lead to β-Ga2O3 films that are nanometer-thin over wafer-scale areas.

Thermoelectrics (TEs) are an important class of technologies for harvesting electric power directly from heat sources. To design high performace TE materials, valleytronics has great theoretical potential to maximize a dimensionless figure of merit ZT but has not yet been demonstrated experimentally. Pseudocubic structure approach based on valleytronics paves a new path to manipulate valley degeneracy and anisotoropy with low thermal conductivity caused by short-range lattice distortion. Here, we report a record high ZT = 1.6 around 800 K, realized in totally enviromentally benign Na-doped Cu2ZnSnS4 (CZTS) single crystal. The exceptional performance comes from a high power factor while maintaining intrinsically low thermal conductivity. The results demonstrate that valleytronics is a new strategy and direction in the TE field, which takes advantage of simple material nature tuning without complex techniques.

In this work, we quantify electronic and ionic contributions to conductivity in the bulk and depletion widths of back-to-back sputtered Pt Schottky contacts on single crystals of β-Ga2O3. We also demonstrate asymmetric changes to these contacts induced by DC bias at temperatures as low as 200 °C, which has obvious bearing on the performance and reliability of devices. Crystals, which were unintentionally doped, doped with Zr donors, and doped with Mg acceptors, were characterized from room temperature to 900 °C. Electrochemical impedance spectroscopy, current–voltage (IV), capacitance–voltage, and the Wagner DC polarization method were employed to characterize changes in conductivity, doping, and built-in potentials with temperature and bias. This work demonstrates that ionic conductivity can be on-par with electronic conductivity in multiple circumstances in bulk crystal samples and leads to changes in Schottky contacts with an applied bias. While it has not been demonstrated that these phenomena are endemic to all melt-grown β-Ga2O3 crystals and epitaxially grown layers were not investigated, these results highlight the importance of understanding and controlling ionic conductivity and defect reactions involving impurities and native defects to enable reliable and long-lived β-Ga2O3 power devices.

We report a volume defect behavior in CdTe crystals grown by the travelling heater method (THM), involving dislocation clustering and grain nucleation. Spurious grain nucleation events occur within a specific radial zone in the crystal where the growth interface is planar. These grains were characterized by Laue x-ray diffraction and were found to have the same angle of misorientation to the bulk, with exception of an in-plane rotation. The grains were connected to columnar dislocation clusters that were aligned parallel to the growth axis of the crystal and were evidently linked to the planar region of the growth interface. Simulation of the growth process was used to investigate the effects of solvent zone convection and interface curvature with different rotational rates. The observed defect behavior was attributed to the effect of melt convection on the interface shape and instability. Evidence of faceting on the growth interface and its correlation with spurious grain nucleation is shown. These findings highlight the importance of interface engineering in THM growth of high quality CdTe single crystals.

We report polarization dependent photoluminescence studies on unintentionally-, Mg-, and Ca-doped β-Ga2O3 bulk crystals grown by the Czochralski method. In particular, we observe a wavelength shift of the highest-energy UV emission which is dependent on the pump photon energy and polarization. For 240 nm (5.17 eV) excitation almost no shift of the UV emission is observed between E||b and E||c, while a shift of the UV emission centroid is clearly observed for 266 nm (4.66 eV), a photon energy lying between the band absorption onsets for the two polarizations. These results are consistent with UV emission originating from transitions between conduction band electrons and two differentially-populated self-trapped hole (STH) states. Calcuations based on hybrid and self-interaction-corrected density functional theories further validate that the polarization dependence is consistent with the relative stability of two STHs. This observation implies that the STHs form primarily at the oxygen atoms involved in the original photon absorption event, thus providing the connection between incident polarization and emission wavelength. The data imposes a lower bound on the energy separation between the self-trapped hole states of ~70–160 meV, which is supported by the calculations.

Perovskites based on methylammonium lead halides, CH3NH3PbX3 (X = Cl, Br, I), have emerged as one of the most promising materials in solar cell technology. Although the photovoltaics field has witn...

The degradation of methyl-ammonium lead iodide (MAPbI3) upon exposure to air is a potentially limiting effect for large scale MAPbI3 photovoltaic production. Here, we report a systematic study on effects of air-exposure on the structural and optical properties of MAPbI3 thin films. The X-ray diffraction studies indicate a shrinking volume of MAPbI3 upon air-exposure as the material decomposes back to its precursors, methyl amine (CH3NH2) and lead iodide (PbI2). However, the photoluminescence (PL) yield and carrier lifetime measured with time-resolved photoluminescence, show an increasing trend upon air-exposure. These phenomena can be explained by self-passivation of MAPbI3 grains by PbI2 layer that reduces the number of non-radiative recombination centres at the grain boundaries. However, this process is not self-limiting and it eventually leads to a film that has completely reverted back to its precursor state. It is shown that this conversion of MAPbI3 film back to its precursors is also accelerated by exposure to laser illumination. Furthermore, we report unusual variation of PL intensity on a shorter time scale of a few seconds in all the films used for the experiment. The variations are found to follow different trends in the encapsulated samples as compared to the un-encapsulated samples. We propose that the decomposition followed by the ionic diffusion through film is responsible for such unusual behaviours.

We report the growth of p -type As-doped, Cd-rich CdTe single crystals using metallic Cd as the solvent in the traveling-heater method. We investigate the growth process from Cd solution in terms of the solid-liquid interface shape and the effects of As incorporation on p -type doping. The resulting CdTe crystals have Cd-rich composition which enhances p -type doping. The As doping efficacy was measured for As concentrations by the combination of inductively coupled plasma mass spectrometry, capacitance-voltage measurements. The p -type doping concentration varied from 6 × 10 15 to 8 × 10 16 cm −3 with increasing As concentration, with an apparent doping limit just below 10 17 cm −3 .

This paper reports on the modulation of Schottky barrier heights (SBH) on three different orientations of $\beta$-Ga$_2$O$_3$ by insertion of an ultra-thin SiO$_2$ dielectric interlayer at the metal-semiconductor junction, which can potentially lower the Fermi-level pinning (FLP) effect due to metal-induced gap states (MIGS). Pt and Ni metal-semiconductor (MS) and metal-interlayer-semiconductor (MIS) Schottky barrier diodes were fabricated on bulk n-type doped $\beta$-Ga$_2$O$_3$ single crystal substrates along the (010), (-201) and (100) orientations and were characterized by room temperature current-voltage (I-V) and capacitance-voltage (C-V) measurements. Pt MIS diodes exhibited 0.53 eV and 0.37 eV increment in SBH along the (010) and (-201) orientations respectively as compared to their respective MS counterparts. The highest SBH of 1.81 eV was achieved on the (010)-oriented MIS SBD using Pt metal. The MIS SBDs on (100)-oriented substrates exhibited a dramatic increment ($>$1.5$\times$) in SBH as well as reduction in reverse leakage current. The use of thin dielectric interlayers can be an efficient experimental method to modulate SBH of metal/Ga$_2$O$_3$ junctions., Comment: 8 pages, 10 figures, 2 tables

We report on the growth and characterization of metalorganic vapor-phase epitaxy-grown \b{eta}-(AlxGa1-x)2O3/\b{eta}-Ga2O3 modulation-doped heterostructures. Electron channel is realized in the heterostructure by utilizing a delta-doped \b{eta}-(AlxGa1-x)2O3 barrier. Electron channel characteristics are studied using transfer length method, capacitance-voltage and Hall measurements. Hall sheet charge density of 1.06 x 1013 cm-2 and mobility of 111 cm2/Vs is measured at room temperature. Fabricated transistor showed peak current of 22 mA/mm and on-off ratio of 8 x 106. Sheet resistance of 5.3 k{\Omega}/Square is measured at room temperature, which includes contribution from a parallel channel in \b{eta}-(AlxGa1-x)2O3., Comment: 22 pages, 4 figures

We report on silicon delta doping of metalorganic vapor-phase epitaxy-grown \b{eta}-Ga2O3 thin films using silane precursor. Delta-doped \b{eta}-Ga2O3 epitaxial films are characterized using capacitance-voltage profiling and secondary-ion mass spectroscopy. Electron sheet charge density in the range of 2.9e12 cm-2 to 8e12 cm-2 with a half width at half maximum ranging from 6.2 nm to 3.5 nm is measured. We also demonstrate a high density (6.4e12 cm-2) degenerate two-dimensional electron gas using a delta-doped \b{eta}-(Al0.26Ga0.74)2O3/\b{eta}-Ga2O3 heterostructure.The total charge could also include a contribution from a parallel channel in the \b{eta}-(Al0.26Ga0.74)2O3 alloy barrier.

Ultra-fast thermal annealing of semiconductor materials using a laser can be revolutionary for short processing times and low manufacturing costs. Here we investigate Cu-In-Se thin films as precursors for CuInSe

Spread spectrum time domain reflectometry (SSTDR) can be used to measure complex impedances in live electrical systems by evaluating the shape and magnitude of the reflected signature. A range of capacitors or inductors can be identified, but above and below this range, they cannot be distinguished from open or short circuits. This range depends on the frequency band of the reflectometry system and characteristic impedance of the transmission line. This can be used to characterize changes in complex impedance for the purpose of fault detection in complex loads, such as PV panels and systems.

The process for growing very large CdTe grains on MZO has been explored with the CdCl2 treatment performed for 1-30 minutes for varying film thicknesses and deposition methods.. Large grain growth occurred for thick films after 15 min. at 450°C. The minority lifetime also increased according to room temperature photoluminescence. The activation of the grain growth during the CdCl2 treatment is explained using the CdTe-CdCl2 phase diagram with preferential grain growth for Te rich grain boundaries explained by the Cd-Te-Cl Ternary phase diagram

Three-dimensional (3D) semimetals have been predicted and demonstrated to have a wide variety of interesting properties associated with their linear energy dispersion. In analogy to two-dimensional (2D) Dirac semimetals, such as graphene, Cd

We investigate the effects of high-rate and high total doses of 60Co gamma rays on the current–voltage (IV) characteristics of GaN p+n diodes grown by metal-organic chemical vapor phase epitaxy on Ga-face (0001) sapphire and hydride vapor phase epitaxy freestanding GaN substrates. We show that diodes grown on sapphire undergo more permanent changes upon irradiation at doses up to 3900 kGy than those grown on freestanding GaN. By combining diode and circular transfer length method measurements, we show that the p-type contact interface and adjacent p++ Mg-doped layer are sensitive to irradiation. In initial experiments, diodes grown on sapphire exhibited p-type contacts with Schottky characteristics, while those on freestanding GaN were Ohmic. Serendipitously, we identified and subsequently irradiated a freestanding sample with a pre-irradiation spatial gradient of p-contact Schottky vs Ohmic behavior across the die. This sample allowed the root cause of induced change to be identified as differences in the p++ contacting layer. We show that the p-type contact's pre-irradiation Schottky behavior is predictive of diodes' IV characteristics changing significantly upon gamma-ray irradiation. Further, we observe that the IV curves of diodes on freestanding GaN recover fully over several weeks at room temperature to be indistinguishable from pre-irradiation. IV curves from diodes on sapphire do not fully recover; we thus hypothesize that interactions between radiation-induced point defects and threading dislocations affect the evolution of radiation damage.