7 results on '"Ney, David"'
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2. Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS
3. Moisture Diffusion in Dense SiO2 and Ultra Low k Integrated Stacks
4. Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions
5. Redundancy method to assess electromigration lifetime in power Grid design
6. Managing SRAM reliability from bitcell to library level
7. Microstructure local effect for electromigration reliability improvement and Cu damascene lines design rules relaxation.
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