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Your search keyword '"S., Trushkin"' showing total 8 results

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8 results on '"S., Trushkin"'

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1. Static and dynamic characteristics of the integrated assessment of the radiation resistance of LSI of the hardware means of information protection

2. Features of the model of main information failures in digital CMOS VLSI at impact of the radiation

3. THE DIGITAL ICS RELIABILITY ASSESSMENT UNDER THE INFLUENCE OF RADIATION

5. Photoionization Emission Models for the Cyg X-3 X-Ray Spectrum.

7. High pressure luminescence of ZnTe:Cr2+ crystals.

8. Extreme particle acceleration in the microquasar Cygnus X-3.

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