THE DIGITAL ICS RELIABILITY ASSESSMENT UNDER THE INFLUENCE OF RADIATION

The article considers digital ICs safe operation predicting methods under the influence of radiation based on fuzzy digital automaton and topological probabilistic models for assessing their performance. While ICs radiation behavior actual nature is determined by the specific ratio of the radiation-sensitive parameters of its elements and taking into account the impact of their statistical dispersion. ICs failures modeling methods under exposed to radiation, which are based on models of fuzzy digital automaton Brauer and probabilistic reliability of the machine.