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We newly fabricated a trapezoidal main pole by focused ion beam (FIB) trimming method at wafer level. A layer of the main pole (MP) is FeCo/Ru multilayer made by sputtering. The thickness of the MP is 0.28 [micro]m, and Ta protective layer is 0.17 [micro]m thick. The taper angle of the MP is 10[degrees]. It is very easy to control of the angle and the width of the MP by using this method. In addition, the manufacturing methods of the MP film are not limited, and the multilayered film is enabled. Moreover, the processing precision of MP by the FIB method became a very practicable result. The head, which had been made by this method, has good characteristics. Index Terms--Focused ion beam (FIB), perpendicular recording, single-pole-type-head, trimming.

Our new write head is trimmed using a focused ion beam (FIB) at the wafer level before depositing a protective layer of A1203. Since this head has no hollows, no Ga implantation, and no recessions caused by the ion beam at the air bearing surface (ABS), it can achieve good write performance at very low flying height with high reliability. Our new fabrication technique also protects the Magnetoresistive (MR) sensor from exposure to the ion beam. We fabricated an inductive-write/MR-read composite head. Test results exhibited a write performance as good as that of non-trimmed wide heads, while providing a smaller erase width. Index Terms - FIB, MR, Trimming, Write head

In this paper, we propose a new concept and fabrication process for magnetic disks with embedded servo patterns, named ESPAR. A servo pattern for phase detection consisting of straight lines is formed by photolithography. The disk has a flat and smooth surface for proximity recording. Servo layer thickness and recording layer thickness can be designed independently. We fabricated the disk and demonstrated the demodulation of the servo signal.

Our flux-guided magnetoresistive-read/inductive-write composite head, which we named the WING MR head after the shape of its wide flux-guides, is designed for very low flying height or contact recording. It has 0.05 [[micro]meter]-thick NiFe single layer flux-guides. The flux-guides are rectangular and wider than the read width. Test results show high linear density resolution and good offtrack characteristics at a flying height of 0.03 [[micro]meter]. The wide flux-guides reduce Barkhausen noise without lowering offtrack performance.

Background: Tumors other than ductal adenocarcinomas constitute 10%-15% of all pancreatic tumors. We describe the performance and pitfalls of endoscopic ultrasound-guided fine-needle aspiration (EUS-FNA) for diagnosis of these rare pancreatic tumors and their characteristic cytopathological features.Methods: The records of 455 pancreatic fine-needle aspiration procedures done between March 1997 and August 2006 at Aichi Cancer Center, Nagoya, Japan, were reviewed. Besides cytology, aspirated material was routinely submitted in formalin for cell-block analysis. The reference standard for final diagnosis was surgical pathology from resected specimens.Results: Twenty-eight rare (nonductal adenocarcinomas) pancreatic tumors were identified. Overall, EUS-FNA with the results of cytology, cell-block processing, and immunohistochemistry could correctly diagnose the type of neoplasm in 19 (67.9%) cases. EUS-FNA could distinguish benign from malignant rare tumors with a sensitivity of 69.2%, a specificity of 100%, positive predictive value of 100%, negative predictive value of 79.0%, and accuracy of 85.7%. None of three malignant pancreatic endocrine neoplasms could be diagnosed as malignant. An adequate core tissue sample could be obtained in 21 cases (75.0%) and provide a histopathological diagnosis in 19 (67.9%) cases. EUS-FNA could change the presumptive diagnosis in 11 (39.3%) cases. Specific immunochemical studies were useful adjuncts to the diagnosis. No major or minor complication was noted in any patient.Conclusions: Pancreatic neoplasms other than ductal adenocarcinomas have diverse imaging and histopathological features. EUS-FNA is accurate and safe for their identification. [ABSTRACT FROM AUTHOR]

Dynamic observation of the growth of Cu on clean and hydrogen-terminated Si(111) surfaces was carried out by using low energy electron microscopy (LEEM). On the clean surface, the two-dimensional "5 x 5" structure is formed, and the formation process of the "5 x 5" structure depends on the substrate temperature. Triangular islands are grown on the "5 x 5" structure after further deposition of Cu. On the other hand, the nanoscale islands are directly formed on the hydrogen-terminated surface below about 400°C. Above about 400°C, however, the Cu-induced desorption of hydrogen takes place, and the growth process becomes similar to that on the clean surface. [ABSTRACT FROM AUTHOR]

Spectroscopic photoemission and low energy electron microscope (SPELEEM) improved its performance after installation at BL17SU/SPring-8, where a multipolarization-mode undulator is employed to produce circularly and linearly polarized soft x rays. This undulator enables us to study the domain structures of ferromagnetic and antiferromagnetic materials by x-ray magnetic circular dichroism and x-ray magnetic linear dichroism. SPELEEM is used to study light elements (C, N, and O), 3d transition-metal elements and 4f rare earth elements, utilizing a wide range of photon energies. The two cylindrical mirrors adopted in front of SPELEEM ensure an illumination area of 14×14 μm2 on the samples. The lateral resolution of a secondary electron photoemission electron microscope image is estimated to be better than 85 nm, whereas the energy resolution of the instrument is better than 0.4 eV. [ABSTRACT FROM AUTHOR]