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Aims: Children of parents with substance use and/or other mental health (SU/MH) diagnoses are at increased risk for health problems. It is unknown whether these children benefit from receiving primary care at the same clinic as their parents. Thus, among children of parents with >1 SU/MH diagnosis, we examined the association of parent-child clinic concordance with rates of well-child checks (WCCs) and childhood vaccinations. Design: Retrospective cohort study using electronic health record (EHR) data from the OCHIN network of community health organizations (CHOs), 2010-2018. Setting: 280 CHOs across 17 states. Participants/Cases: 41,413 parents with >1 SU/MH diagnosis, linked to 65,417 children aged 0 to 17 years, each with >1 visit to an OCHIN clinic during the study period. Measurements: Dependent variables: rates of WCCs during (1) the first 15 months of life, and (2) ages 3 to 17 years; vaccine completeness (3) by the age of 2, and (4) before the age of 18. Estimates were attained using generalized estimating equations Poisson or logistic regression. Findings: Among children utilizing the same clinic as their parent versus children using a different clinic (reference group), we observed greater WCC rates in the first 15 months of life [adjusted rate ratio (aRR) = 1.06; 95% confidence interval (CI) = 1.02-1.10]; no difference in WCC rates in ages 3 to 17; higher odds for vaccine completion before age 2 [adjusted odds ratio (aOR) = 1.12; 95% CI = 1.03-1.21]; and lower odds for vaccine completion before age 18 (aOR = 0.88; 95% CI = 0.81-0.95). Conclusion: Among children whose parents have at least one SU/MH diagnosis, parent-child clinic concordance was associated with greater rates of WCCs and higher odds of completed vaccinations for children in the youngest age groups, but not the older children. This suggests the need for greater emphasis on family-oriented healthcare for young children of parents with SU/MH diagnoses; this may be less important for older children.

Aims: Children of parents with substance use and/or other mental health (SU/MH) diagnoses are at increased risk for health problems. It is unknown whether these children benefit from receiving primary care at the same clinic as their parents. Thus, among children of parents with >1 SU/MH diagnosis, we examined the association of parent-child clinic concordance with rates of well-child checks (WCCs) and childhood vaccinations. Design: Retrospective cohort study using electronic health record (EHR) data from the OCHIN network of community health organizations (CHOs), 2010-2018. Setting: 280 CHOs across 17 states. Participants/Cases: 41,413 parents with >1 SU/MH diagnosis, linked to 65,417 children aged 0 to 17 years, each with >1 visit to an OCHIN clinic during the study period. Measurements: Dependent variables: rates of WCCs during (1) the first 15 months of life, and (2) ages 3 to 17 years; vaccine completeness (3) by the age of 2, and (4) before the age of 18. Estimates were attained using generalized estimating equations Poisson or logistic regression. Findings: Among children utilizing the same clinic as their parent versus children using a different clinic (reference group), we observed greater WCC rates in the first 15 months of life [adjusted rate ratio (aRR) = 1.06; 95% confidence interval (CI) = 1.02-1.10]; no difference in WCC rates in ages 3 to 17; higher odds for vaccine completion before age 2 [adjusted odds ratio (aOR) = 1.12; 95% CI = 1.03-1.21]; and lower odds for vaccine completion before age 18 (aOR = 0.88; 95% CI = 0.81-0.95). Conclusion: Among children whose parents have at least one SU/MH diagnosis, parent-child clinic concordance was associated with greater rates of WCCs and higher odds of completed vaccinations for children in the youngest age groups, but not the older children. This suggests the need for greater emphasis on family-oriented healthcare for young children of parents with SU/MH diagnoses; this may be less important for older children. [ABSTRACT FROM AUTHOR]

Some system-level electrostatic discharge (ESD) tests repeat badly if different ESD generators are used. For improving repeatability, ESD generator specifications have been changed, and modified generators have been compared in a worldwide round robin test. The test showed up to 1 : 3 variations of failure levels. Multiple parameters that characterize ESD generators have been measured. This paper correlates the parameters to test result variations trying to distinguish between important and nonrelevant parameters. The transient fields show large variations among different ESD generators. A correlation has been observed in many equipment under tests (EUTs) between failure levels and the spectral content of the voltage induced in a semicircular loop. EUT resonance enhances the field coupling, and is the dominate failure mechanism. The regulation on the transient field is expected to improve the test repeatability. Index Terms--Correlations, electrostatic discharge (ESD), failure levels, round robin test.

Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed. Index Terms--Electrostatic discharges (ESDs), immunity, scanning, susceptibility.

A method for analyzing electrostatic discharge (ESD) generators and coupling to equipment under test in the frequency domain is proposed. In ESD generators, the pulses are excited by the voltage collapse across relay contacts. The voltage collapse is replaced by one port of a vector network analyer (VNA). All the discrete and structural elements that form the ESD current pulse and the transient fields are excited by the VNA as if they were excited by the voltage collapse. In such a way, the method allows analyzing the current and field-driven linear coupling without having to discharge an ESD generator, eliminating the risk to the circuit and allowing the use of the wider dynamic range of a network analyzer relative to a real-time oscilloscope. The method is applicable to other voltage-collapse-driven tests, such as electrical fast transient, ultrawideband susceptibility testing but requires a linear coupling path. Index Terms--Electrostatic discharge (ESD), network analyzer (NWA), simulation.

The use of the digital signal processing procedure of decimation is introduced as a tool to detect patterns of information entropy distribution and is applied to information entropy in influenza A segment 7. Decimation was able to reveal patterns of entropy accumulation in archival and emerging segment 7 sequences that were not apparent in the complete, undecimated data. The low entropy accumulation along the first 25% of segment 7, revealed by the three frames of decimation, may be a sign of regulation at both protein and RNA levels to conserve important viral functions. Low segment 7 entropy values from the 2009 H1N1 swine flu pandemic suggests either that: (1) the viruses causing the current outbreak have convergently evolved to their low entropy state or (2) more likely, not enough time has yet passed for the entropy to accumulate. Because of its dependence upon the periodicity of the codon, the decimative procedure should be generalizable to any biological system. [ABSTRACT FROM AUTHOR]

This paper presents a scheme to reduce the on-die voltage noise that occurs due a buffer switching event. Both output and input buffer switch events are addressed. A generic power delivery network (PDN) model with parasitic inductance is assumed. A change in current (di/dt) across the inductor is considered the primary cause of the voltage noise. On-die decoupling capacitance is traditionally added to the power delivery network to address this problem and to limit the droop. The method described in the paper shows a principally different approach. The maximum di/dt is managed to reduce the voltage noise. It is proposed to send to a buffer a current waveform from an external supply or to recycle charge from a locally charged capacitance when the di/dt occurs, thus substantially reducing the on-die voltage noise. Alternatively, at a given acceptable level of voltage noise the on-die capacitance can be reduced, providing significantly lower product cost. This paper provides theoretical and modeling background of the pro. posed schemes and includes simulation results on several performance characteristics. [ABSTRACT FROM AUTHOR]

Some system-level electrostatic discharge (ESD) tests repeat badly if different ESD generators are used. For improving repeatability, ESD generator specifications have been changed, and modified generators have been compared in a worldwide round robin test. The test showed up to 1 : 3 variations of failure levels. Multiple parameters that characterize ESD generators have been measured. This paper correlates the parameters to test result variations trying to distinguish between important and nonrelevant parameters. The transient fields show large variations among different ESD generators. A correlation has been observed in many equipment under tests (EUTs) between failure levels and the spectral content of the voltage induced in a semicircular loop. EUT resonance enhances the field coupling, and is the dominate failure mechanism. The regulation on the transient field is expected to improve the test repeatability [ABSTRACT FROM AUTHOR]

A method for analyzing electrostatic discharge (ESD) generators and coupling to equipment under test in the frequency domain is proposed. In ESD generators, the pulses are excited by the voltage collapse across relay contacts. The voltage collapse is replaced by one port of a vector network analyer (VNA). All the discrete and structural elements that form the ESD current pulse and the transient fields are excited by the VNA as if they were excited by the voltage collapse. In such a way, the method allows analyzing the current and field-driven linear coupling without having to discharge an ESD generator, eliminating the risk to the circuit and allowing the use of the wider dynamic range of a network analyzer relative to a real-time oscilloscope. The method is applicable to other voltage-collapse-driven tests, such as electrical fast transient, ultrawideband susceptibility testing but requires a linear coupling path. [ABSTRACT FROM AUTHOR]