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Frequency-domain measurement method for the analysis of ESD generators and coupling

Authors :
Koo, Jayong
Cai, Qing
Muchaidze, Giorgi
Martwick, Andy
Wang, Kai
Pommerenke, David
Source :
IEEE Transactions on Electromagnetic Compatibility. August, 2007, Vol. 49 Issue 3, p504, 8 p.
Publication Year :
2007

Abstract

A method for analyzing electrostatic discharge (ESD) generators and coupling to equipment under test in the frequency domain is proposed. In ESD generators, the pulses are excited by the voltage collapse across relay contacts. The voltage collapse is replaced by one port of a vector network analyer (VNA). All the discrete and structural elements that form the ESD current pulse and the transient fields are excited by the VNA as if they were excited by the voltage collapse. In such a way, the method allows analyzing the current and field-driven linear coupling without having to discharge an ESD generator, eliminating the risk to the circuit and allowing the use of the wider dynamic range of a network analyzer relative to a real-time oscilloscope. The method is applicable to other voltage-collapse-driven tests, such as electrical fast transient, ultrawideband susceptibility testing but requires a linear coupling path. Index Terms--Electrostatic discharge (ESD), network analyzer (NWA), simulation.

Details

Language :
English
ISSN :
00189375
Volume :
49
Issue :
3
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electromagnetic Compatibility
Publication Type :
Academic Journal
Accession number :
edsgcl.168398721