1. Carrier squeezing interferometry with π/2 phase shift at the synthetic wavelength: Phase extraction in simultaneous dual-wavelength interferometry
- Author
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Jinlong Cheng, Zhongming Yang, Hu Jie, Qun Yuan, Jialing Huang, Zhishan Gao, Chen Ming, and Yao Yanxia
- Subjects
Accuracy and precision ,Phase (waves) ,02 engineering and technology ,01 natural sciences ,law.invention ,010309 optics ,Root mean square ,symbols.namesake ,020210 optoelectronics & photonics ,Optics ,law ,0103 physical sciences ,0202 electrical engineering, electronic engineering, information engineering ,Electrical and Electronic Engineering ,Physics ,business.industry ,Mechanical Engineering ,Fresnel lens ,Moiré pattern ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,Wavelength ,Interferometry ,Fourier transform ,symbols ,business - Abstract
Dual-wavelength interferometry (DWI) could extend the measured range of each single-wavelength interferometry. The synchronization of the two working wavelengths in DWI is of high efficient, and the generated moire fringe indirectly represents the information of the measured long synthetic-wavelength (λS) phase. However, the extraction of the measured synthetic-wavelength phase is rather arduous from the moire fringe. To retrieve the synthetic-wavelength phase from the moire fringe patterns, we present a carrier squeezing dual-wavelength interferometry method (CSDI) in simultaneous DWI (SDWI). After the mathematical square of the moire fringe patterns, the multiplicative moire phase-shift fringe patterns with π/2 phase shift at λS are combined into a single spatial-temporal fringe (STF). By converting the temporal phase shift into spatial carrier and the introduction of the carrier, the measured synthetic wavelength phase is retrieved by the filter and inverse Fourier transform of the STF spectrum. Compared with other methods, CSDI method could suppress the influence of the phase-shift error and only requires 4 frame phase-shift interferograms. Numerical simulations are executed to demonstrate the performance of the CSDI method in SDWI with the peak-to-valley (PV) value of 1.46 nm and the root mean square (RMS) values of 0.23 nm for the demodulated error. And the precision is better than PV of 20 nm (0.0059λs) and RMS of 6 nm (0.0017λs) even when the distribution range of the phase-shift error is as high as ± 10% relative to the π/2 phase shift step at λS. Finally, our experimental results indicate that the measurement accuracy is better than 1.3% for a step with the height of 7.8 µm, and 0.5% for the step height of 6.233 µm for a Fresnel lens.
- Published
- 2018