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Carrier squeezing interferometry with π/2 phase shift at the synthetic wavelength: Phase extraction in simultaneous dual-wavelength interferometry
- Source :
- Optics and Lasers in Engineering. 107:288-298
- Publication Year :
- 2018
- Publisher :
- Elsevier BV, 2018.
-
Abstract
- Dual-wavelength interferometry (DWI) could extend the measured range of each single-wavelength interferometry. The synchronization of the two working wavelengths in DWI is of high efficient, and the generated moire fringe indirectly represents the information of the measured long synthetic-wavelength (λS) phase. However, the extraction of the measured synthetic-wavelength phase is rather arduous from the moire fringe. To retrieve the synthetic-wavelength phase from the moire fringe patterns, we present a carrier squeezing dual-wavelength interferometry method (CSDI) in simultaneous DWI (SDWI). After the mathematical square of the moire fringe patterns, the multiplicative moire phase-shift fringe patterns with π/2 phase shift at λS are combined into a single spatial-temporal fringe (STF). By converting the temporal phase shift into spatial carrier and the introduction of the carrier, the measured synthetic wavelength phase is retrieved by the filter and inverse Fourier transform of the STF spectrum. Compared with other methods, CSDI method could suppress the influence of the phase-shift error and only requires 4 frame phase-shift interferograms. Numerical simulations are executed to demonstrate the performance of the CSDI method in SDWI with the peak-to-valley (PV) value of 1.46 nm and the root mean square (RMS) values of 0.23 nm for the demodulated error. And the precision is better than PV of 20 nm (0.0059λs) and RMS of 6 nm (0.0017λs) even when the distribution range of the phase-shift error is as high as ± 10% relative to the π/2 phase shift step at λS. Finally, our experimental results indicate that the measurement accuracy is better than 1.3% for a step with the height of 7.8 µm, and 0.5% for the step height of 6.233 µm for a Fresnel lens.
- Subjects :
- Accuracy and precision
Phase (waves)
02 engineering and technology
01 natural sciences
law.invention
010309 optics
Root mean square
symbols.namesake
020210 optoelectronics & photonics
Optics
law
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
Electrical and Electronic Engineering
Physics
business.industry
Mechanical Engineering
Fresnel lens
Moiré pattern
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
Wavelength
Interferometry
Fourier transform
symbols
business
Subjects
Details
- ISSN :
- 01438166
- Volume :
- 107
- Database :
- OpenAIRE
- Journal :
- Optics and Lasers in Engineering
- Accession number :
- edsair.doi...........b6da5558853443ffd52f4d0e9d5be512