1. Embedded STT-MRAM in 28-nm FDSOI Logic Process for Industrial MCU/IoT Application
- Author
-
Yongsung Ji, Gitae Jeong, Joo-Chan Kim, Seungbae Lee, Daesop Lee, Yong-Kyu Lee, Hyun-Taek Jung, Ki-Chul Park, Hwang So-Hee, Artur Antonyan, Kwanhyeob Koh, J.W. Lee, Yoon-Jong Song, Hyeongsun Hong, Kilho Lee, Ung-hwan Pi, Ki-Hyun Hwang, Jung-Man Lim, Jong Shik Yoon, Hyunsung Jung, Daehyun Jang, Mark Pyo, Bo-Young Seo, SangHumn Lee, E. S. Jung, Byoung-Jae Bae, Hyunchul Shin, and Oh Se-Chung
- Subjects
010302 applied physics ,Magnetoresistive random-access memory ,business.industry ,Computer science ,Transistor ,Process (computing) ,Silicon on insulator ,02 engineering and technology ,Reuse ,Modular design ,021001 nanoscience & nanotechnology ,01 natural sciences ,law.invention ,Microcontroller ,Operating temperature ,law ,Embedded system ,0103 physical sciences ,0210 nano-technology ,business - Abstract
We demonstrate, for the first time, 28-nm embedded STT-MRAM operating at full industrial temperature range (−40~125°C) with >1E+6 endurance and >10 year retention for high speed MCU/IoT application. Robust cell operation is also demonstrated after solder reflow (260°C, 90 second) and during external magnetic disturbance (550-Oe under writing). It is built on 28-nm FDSOI technology in modular format for IP reuse and has great potential to serve wide variety of applications such as IoT, and high performance MCU.
- Published
- 2018
- Full Text
- View/download PDF