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Your search keyword '"Horiguchi, N"' showing total 2 results
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2 results on '"Horiguchi, N"'

1. Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets

Author

Bury, E, Chasin, A, Kaczer, B, Vandemaele, M, Tyaginov, S, Franco, J, Ritzenthaler, R, Mertens, H, Weckx, P, Horiguchi, N, and Linten, D

Subjects
FET arrays, Technology, Science & Technology, HCD, Physics, Engineering, Multidisciplinary, Engineering, Electrical & Electronic, Nanosheet FETs, Forksheet FETs, trapping, Physics, Applied, Engineering, hot-carrier degradation, Physical Sciences, FSH, oxide defects, interface degradation, NSH
Abstract

ispartof: 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) ispartof: IEEE International Reliability Physics Symposium (IRPS) location:TX, Dallas date:27 Mar - 31 Mar 2022 status: published

Published
2022

2. Enabling Logic with Backside Connectivity via n-TSVs and its Potential as a Scaling Booster

Author

Veloso, A., Jourdain, A., Hiblot, G., Filip Schleicher, D Have, K., Sebaai, F., Radisic, D., Loo, R., Hopf, T., Keersgieter, A., Arimura, H., Eneman, G., Favia, P., Geypen, J., Arutchelvan, G., Chasin, A., Jang, D., Nyns, L., Rosseel, E., Hikavyy, A., Mannaert, G., Chan, B. T., Devriendt, K., Demuynck, S., Plas, G., Ryckaert, J., Beyer, G., Litta, E. D., Beyne, E., and Horiguchi, N.

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