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1. Magnetic Force Microscopy - Towards higher resolution

Author

Abelmann, Leon, van den Bos, A.G., Lodder, J.C., Hopster, H., and Oepen, H.P.

Subjects
Materials science, SMI-EXP: EXPERIMENTAL TECHNIQUES, TSTNE-Probe-MFM: Magnetic Force Microscope, business.industry, Resolution (electron density), High resolution, METIS-212069, SMI-TST: From 2006 in EWI-TST, Optics, IR-66340, EWI-6875, Magnetic force microscope, TST-uSPAM: micro Scanning Probe Array Memory, TST-MFM: Magnetic Force Microscope, business, Magnetic coating
Abstract

In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high resolution and the design and realisation of MFM tips.

Published
2005

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