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Magnetic Force Microscopy - Towards higher resolution

Authors :
Abelmann, Leon
van den Bos, A.G.
Lodder, J.C.
Hopster, H.
Oepen, H.P.
Source :
Magnetic Microscopy of Nanostructures, 253-283, STARTPAGE=253;ENDPAGE=283;TITLE=Magnetic Microscopy of Nanostructures, Magnetic Microscopy of Nanostructures ISBN: 9783540401865
Publication Year :
2005

Abstract

In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high resolution and the design and realisation of MFM tips.

Subjects

Subjects :
Materials science
SMI-EXP: EXPERIMENTAL TECHNIQUES
TSTNE-Probe-MFM: Magnetic Force Microscope
business.industry
Resolution (electron density)
High resolution
METIS-212069
SMI-TST: From 2006 in EWI-TST
Optics
IR-66340
EWI-6875
Magnetic force microscope
TST-uSPAM: micro Scanning Probe Array Memory
TST-MFM: Magnetic Force Microscope
business
Magnetic coating

Details

ISBN :
978-3-540-40186-5
ISSN :
15334880
ISBNs :
9783540401865
Database :
OpenAIRE
Journal :
Magnetic Microscopy of Nanostructures
Accession number :
edsair.doi.dedup.....3c0c42852a8517959691b9fcdb0d6274

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Authors Abstract Subjects Details