1. Microdetector system for speedy X-ray studies
- Author
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O. S. Kovalchuk, V. V. Burdin, V. A. Kyva, V. M. Militsiya, M. V. Minakov, Ie. O. Petrenko, V . M. Pugatch, D. I. Storozhyk, J. Heuser, S. O. Firstov, and A. V. Chaus
- Subjects
X-rays diffraction ,position sensitive detectors ,transient phase transformations ,temperature dependence of phase transformations in metals ,microstrip silicon detectors ,Atomic physics. Constitution and properties of matter ,QC170-197 - Abstract
Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°.
- Published
- 2016