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Microdetector system for speedy X-ray studies

Authors :
O. S. Kovalchuk
V. V. Burdin
V. A. Kyva
V. M. Militsiya
M. V. Minakov
Ie. O. Petrenko
V . M. Pugatch
D. I. Storozhyk
J. Heuser
S. O. Firstov
A. V. Chaus
Source :
Âderna Fìzika ta Energetika, Vol 17, Iss 4, Pp 400-405 (2016)
Publication Year :
2016
Publisher :
Institute for Nuclear Research, National Academy of Sciences of Ukraine, 2016.

Abstract

Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°.

Details

Language :
English, Russian, Ukrainian
ISSN :
1818331X and 20740565
Volume :
17
Issue :
4
Database :
Directory of Open Access Journals
Journal :
Âderna Fìzika ta Energetika
Publication Type :
Academic Journal
Accession number :
edsdoj.6b31ecb9fe4c54bdc70adc68b1f4af
Document Type :
article