Author: "Oshida, D." / Language: english - Searchworks@Jio Institute Digital Library Search Results

Searchworks

Select search scope, currently: Articles

Catalog

books, media & more in Jio Institute collections

Articles

journal articles & other e-resources

Your search keyword '"Oshida, D."' showing total 4 results

Start Over Author "Oshida, D." Language english

4 results on '"Oshida, D."'

1. Prediction of early failure due to non-visual defect on time-dependent dielectric breakdown of low-k dielectrics: Experimental verification of a yield-reliability model.

Author: Yokogawa, S., Oshida, D., Tsuchiya, H., Taiji, T., Morita, T., Tsuchiya, Y., and Takewaki, T.
Published: 2008
Full Text: View/download PDF

2. Highly reliable molecular-pore-stacking (MPS)/Cu interconnects using novel post-etching treatment (PET) for 28 nm-node and beyond.

Author: Oshida, D., Kume, I., Kunishima, H., Tsuchiya, H., Katsuyama, H., Ueki, M., Iguchi, M., Yokogawa, S., Inoue, N., Oda, N., and Sakurai, M.
Published: 2011
Full Text: View/download PDF

3. Path-finding for integration of porous SiOCH films (k∼2.5) in system-LSIs.

Author: Inoue, N., Ueki, M., Yamamoto, H., Kume, I., Iguchi, M., Kaneko, T., Honda, H., Oshida, D., Ozawa, K., Ishizuka, I., Horikoshi, Y., Kawahara, J., and Hayashi, Y.
Published: 2010
Full Text: View/download PDF

4. Quantitative analysis of correlation between insulator surface copper contamination and TDDB lifetime based on actual measurement.

Author: Oshida, D., Takewaki, T., Iguchi, M., Taiji, T., Morita, T., Tsuchiya, Y., Tsuchiya, H., Yokogawa, S., Kunishima, H., Aizawa, H., and Okada, N.
Published: 2008
Full Text: View/download PDF

Catalog

Books, media, physical & digital resources

See catalog results