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1. A Microwave Broadband Technique to Measure the Complex Resistivity of HTS Thin Films.

Author

Tosoratti, Nevio, Fastampa, Renato, Giura, Maurizio, Lenzi, Vasco, Sarti, Stefano, and Silva, Enrico

Subjects
*HIGH temperature superconductors, *SEMICONDUCTOR films, *ELECTRIC properties of thin films, *ELECTRIC resistance, *ELECTRONICS
Abstract

Evaluates a microwave broadband technique to measure the complex electric resistivity of high temperature superconductor thin films. Extraction of film resistivity from measured reflection coefficients; Electromagnetic analysis of the coaxial circular transition structure; Coaxial line calibration.

Published
2001
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