51 results on '"Kim, Seung-Woo"'
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2. Frequency-comb-based ultrastable terahertz-frequency synthesizer traceable to an optical reference
3. Frequency comb-to-comb synchronization between a 1.3-km free-space link via an optical frequency transfer
4. Absolute distance measurement system for precise 3D positioning
5. Direct comb multi-heterodyne interference spectroscopy
6. High harmonics generation by plasmonic field enhancement.
7. Design of nanostructures for high harmonic generation by localized surface plasmon resonance.
8. Continuous scanning phase measurement for high immunity to vibration.
9. Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures.
10. Surface metrology of silicon wafers using a femtosecond pulse laser.
11. Dispersive white light interferometry for 3D inspection of thin film layers of flat panel displays.
12. Grating projection Moire interferometry for high-speed 3D inspection of mesoscale objects.
13. Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry.
14. A point-diffraction interferometer with vibration-desensitizing capability.
15. Absolute distance measurements using point-diffracted spherical waves.
16. AFM-based nanofabrication with femtosecond pulse laser radiation.
17. Absolute distance measurement using femtosecond laser.
18. Nonparaxial Fresnel diffraction from oblique end facets of optical fibers.
19. Low-coherence interferometry for 3D measurements of microelectronics packaging and integration.
20. Dispersive white-light interferometry for thin-film thickness profile measurement.
21. Point-diffraction fiber interferometer for vibration desensitization.
22. Two-point diffraction interferometer for absolute distance measurement.
23. Visibility optimization of phase-shifting diffraction-grating interferometer.
24. Error propagation in calibration of e-beam lithography stages.
25. Oblique point-diffraction source for interferometer design.
26. Phase-shifting diffraction grating interferometer for testing concave mirrors.
27. Point-diffraction interferometer for 3D profile measurement of rough surfaces.
28. Compensation for phase change on reflection in white-light scanning interferometry.
29. Fiber optic diffraction interferometer for testing spherical mirrors.
30. Super-heterodyning phase measurement for heterodyne interferometry.
31. Phase-shifting projection moire for out-of-plane displacement measurement.
32. Multipoint diffraction interferometry for 3D profilometry.
33. Stabilization of two frequency combs with a small relative fceojitter using diode laser injection locking
34. Compensation of phase change upon reflection in white light interferometry.
35. Scanning projection grating moire topography.
36. Automatic inspection of geometric accuracy of optical fiber ferrules by machine vision.
37. EUV generation by plasmonic field enhancement using nanostructures
38. Absolute distance measurement using frequency-comb-referenced four-wavelength interferometry
39. Recent advances in absolute distance measurements using femtosecond light pulses
40. Precision 3D surface measurement of step-structures using mode-locked femtosecond pulses
41. White light phase-shifting interferometry with self-compensation of PZT scanning errors.
42. White-light scanning interferometry for thickness measurement of thin film layers.
43. Rapid defect inspection of display devices with optical spatial filtering.
44. Three-dimensional profile measurement of fine objects by phase-shifting shadow moire interferometry.
45. Projection moire for 3D inspection of printed circuit boards.
46. Statistical analysis on the measuring resolution of edge position by digital imaging.
47. Linewidth measurement of wafers using SEM and its uncertainty evaluation.
48. Image compression based on wavelet transform for remote sensing.
49. Plasmonic field enhancement for generating ultrashort extreme-ultraviolet light pulses
50. Generation of multiple optical frequencies referenced to a frequency comb for precision free-space frequency transfer
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