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Keysight designed its i3070 Series 6 in-circuit test (ICT) suite to improve the throughput and operational efficiency of printed circuit board assembly (PCBA) manufacturing. Sensors linked to software tools guide laboratory users through analyses, help them avoid unplanned downtime, and reduce their need to remeasure samples. Mountains 8, which builds on the previous Mountains 7 platform, combines Mountains' profilometer and scanning electron microscope data analysis with SPIP (scanning probe image processor) software from Image Metrology. [Extracted from the article]

I Quantum Field Theory, as Simply as Possible i , A. Zee, Princeton U. Press, 2023, $39.95 Countless books aim to explain quantum mechanics to a lay audience, but few authors have attempted to present a popular introduction to quantum field theory, the mathematical framework linking quantum mechanics with special relativity. A. Zee, a well-known author of several textbooks and popular-science works, attempts to fill that gap in this new book. Yet perhaps the most provocative portion of the book looks toward the past: Rubenstein convincingly demonstrates that NASA and US politicians used Christian imperialist language to justify the Apollo missions. [Extracted from the article]

The article offers brief information on several microscopy and nanotechnology equipment including the N-565 linear stages from Physik Instrumente LP (PI), the Apreo scanning electron microscope from FEI, and the JEM-F200 transmission electron microscope from JEOL USA Inc.

The article offers brief information on biomedical optics and photonics products including Opterra multipoint scanning confocal microscope from Bruker Corp., tungsten low vacuum scanning electron microscopes (SEMs) from JEOL USA Inc. and OBIS Galaxy fiber-optic beam combiner from Coherent Inc.

The article evaluates several new products related to physics, including the ABT-323 scanning electron microscope from Topcon Technologies, Inc., the VacIon Plus series of ion pumps from Varian Vacuum Products, and the Paragon XP/E system supercomputers from Intel Corp.

Reviews Phax-Scan, a scanning electron microscope from Phillips Electronic Instruments.

Reviews the DS-130F, a field-emission scanning electron microscope from International Scientific Instruments.