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Microanalysis by Electron and Spectrometer.
- Source :
-
Physics Today . May89, Vol. 42 Issue 5, p86. 2p. - Publication Year :
- 1989
-
Abstract
- Reviews Phax-Scan, a scanning electron microscope from Phillips Electronic Instruments.
- Subjects :
- *SCIENTIFIC apparatus & instruments
*SCANNING electron microscopes
Subjects
Details
- Language :
- English
- ISSN :
- 00319228
- Volume :
- 42
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Physics Today
- Publication Type :
- Academic Journal
- Accession number :
- 11331404