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Microanalysis by Electron and Spectrometer.

Source :
Physics Today. May89, Vol. 42 Issue 5, p86. 2p.
Publication Year :
1989

Abstract

Reviews Phax-Scan, a scanning electron microscope from Phillips Electronic Instruments.

Details

Language :
English
ISSN :
00319228
Volume :
42
Issue :
5
Database :
Academic Search Index
Journal :
Physics Today
Publication Type :
Academic Journal
Accession number :
11331404