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Because the ability to perform some form of chemical microanalysis has become an essential feature for any microscope, it is necessary to investigate what options are available in the new “ORION” helium ion microscope (HIM). The HIM has the ability to visualize local variations in specimen chemistry in both the ion induced secondary electron and the Rutherford backscattered imaging modes, but this provides only limited and qualitative information. Quantitative, elementally specific, microanalysis could be performed in the HIM using secondary electron spectroscopy, Rutherford backscattered ion spectroscopy, or secondary ion mass spectroscopy, but while each of these options has promise, none of them can presently guarantee either reliable element identification or quantitative analysis across the periodic table. [ABSTRACT FROM AUTHOR]

The article offers information on the journal "Microscopy and Microanalysis (MAM)," Volume 17. It presents a calendar of meetings and events in Nashville, Tennessee on August 5-11, 2011, as well as the floor map of Nashville Convention Center. It mentions various committee and business meetings at Nashville Convention Center along, with the registration cancellation and refund policy. Moreover, information on the members of the Program Committee is presented.

Fellow Microscopists and Microanalysts, Colleagues and most importantly Students, welcome to Microscopy & Microanalysis 2011 here in Nashville, Tennessee, our seventeenth conference under that appellation. [ABSTRACT FROM PUBLISHER]

Information about several symposium to be held in the U.S. in July 2009 which includes the "A-03 Quantitative Atom-Probe Tomography," "A-05 Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences," and the "A-06 Advances in Fluorescent Nanoprobes for Cellular and In-Vivo Imaging."

The article announces awards given by the Microbian Analysis Society (MAS) to scientists including the Duncumb Award for Excellence in Microanalysis to David Joy of the University of Tennessee in Knoxville, the K. F. J. Heinrich Award to Hendrix Demers of the Electrical Engineering Department at the Université de Sherbrooke in Quebec, and the MAS Service Award to Scott Wight of the Surface and Microanalysis Science Division at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011. [ABSTRACT FROM PUBLISHER]

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011. [ABSTRACT FROM PUBLISHER]

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010. [ABSTRACT FROM PUBLISHER]

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009 [ABSTRACT FROM PUBLISHER]