1. Characterization and fabrication of fully metal-coated scanning near-field optical microscopy SiO2 tips
- Author
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R. Eckert, Terunobu Akiyama, Laurent Thiery, L. Aeschimann, Harry Heinzelmann, Urs Staufer, and N. F. de Rooij
- Subjects
010302 applied physics ,Histology ,Fabrication ,Materials science ,Cantilever ,business.industry ,Scanning electron microscope ,Scanning confocal electron microscopy ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Pathology and Forensic Medicine ,law.invention ,Optics ,Optical microscope ,Transmission electron microscopy ,law ,0103 physical sciences ,Transmittance ,Scanning ion-conductance microscopy ,0210 nano-technology ,business - Abstract
The fabrication of silicon cantilever-based scanning near-field optical microscope probes with fully aluminium-coated quartz tips was optimized to increase production yield. Different cantilever designs for dynamic- and contact-mode force feedback were implemented. Light transmission through the tips was investigated experimentally in terms of the metal coating and the tip cone-angle. We found that transmittance varies with the skin depth of the metal coating and is inverse to the cone angle, meaning that slender tips showed higher transmission. Near-field optical images of individual fluorescing molecules showed a resolution < 100 nm. Scanning electron microscopy images of tips before and after scanning near-field optical microscope imaging, and transmission electron microscopy analysis of tips before and after illumination, together with measurements performed with a miniaturized thermocouple showed no evidence of mechanical defect or orifice formation by thermal effects.
- Published
- 2003
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