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Characterization and fabrication of fully metal-coated scanning near-field optical microscopy SiO2 tips

Authors :
R. Eckert
Terunobu Akiyama
Laurent Thiery
L. Aeschimann
Harry Heinzelmann
Urs Staufer
N. F. de Rooij
Source :
Journal of Microscopy. 209:182-187
Publication Year :
2003
Publisher :
Wiley, 2003.

Abstract

The fabrication of silicon cantilever-based scanning near-field optical microscope probes with fully aluminium-coated quartz tips was optimized to increase production yield. Different cantilever designs for dynamic- and contact-mode force feedback were implemented. Light transmission through the tips was investigated experimentally in terms of the metal coating and the tip cone-angle. We found that transmittance varies with the skin depth of the metal coating and is inverse to the cone angle, meaning that slender tips showed higher transmission. Near-field optical images of individual fluorescing molecules showed a resolution < 100 nm. Scanning electron microscopy images of tips before and after scanning near-field optical microscope imaging, and transmission electron microscopy analysis of tips before and after illumination, together with measurements performed with a miniaturized thermocouple showed no evidence of mechanical defect or orifice formation by thermal effects.

Details

ISSN :
00222720
Volume :
209
Database :
OpenAIRE
Journal :
Journal of Microscopy
Accession number :
edsair.doi...........8357e11f7d67ea1fa866cd7700aeb9cb
Full Text :
https://doi.org/10.1046/j.1365-2818.2003.01107.x