1. Strain mapping accuracy improvement using super-resolution techniques
- Author
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A. D. Utrilla, David González, M. P. Guerrero-Lebrero, JM José Maria Ulloa, Alvaro Mayoral, D. Fernández-Reyes, Pedro L. Galindo, Elisa Guerrero, and Guillermo Bárcena-González
- Subjects
010302 applied physics ,Histology ,Field (physics) ,Computer science ,business.industry ,Resolution (electron density) ,Strain mapping ,02 engineering and technology ,Iterative reconstruction ,021001 nanoscience & nanotechnology ,Accuracy improvement ,computer.software_genre ,01 natural sciences ,Dark field microscopy ,Pathology and Forensic Medicine ,Optics ,Software ,Computer Science::Computer Vision and Pattern Recognition ,0103 physical sciences ,Digital image processing ,Data mining ,0210 nano-technology ,business ,computer - Abstract
Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images.
- Published
- 2015