1. Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency band
- Author
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Ugur Cem Hasar, Yunus Kaya, Musa Bute, Joaquim J. Barroso, Mehmet Ertugrul, and Bayburt University
- Subjects
Complex permittivity ,Permittivity ,Materials science ,Electric properties ,Analytical analysis ,Frequency band ,General Physics and Astronomy ,Sample (statistics) ,Dielectric ,Broadband measurements ,Complex permittivity measurement ,Radio spectrum ,Low loss material ,Simple (abstract algebra) ,Broadband ,Frequency bands ,materials testing ,Electrical and Electronic Engineering ,Nicolson-Ross-Weir methods ,Microwave measurement ,microwave measurements ,Numerical analysis ,Permittivity measurement ,low-loss samples ,Research papers ,permittivity ,Electronic, Optical and Magnetic Materials ,Computational physics ,Numerical methods ,Low-loss - Abstract
In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inaccurate peaks for measurements of electrical properties of low-loss samples in the well-known Nicolson-Ross-Weir method. Without using this factor in the expressions and combining better features of the methods available in the literature, the proposed procedure allows highly accurate permittivity measurements over a broad band. We have validated the proposed method by permittivity measurements of a low-loss sample by different methods. © 2014 Taylor & Francis.
- Published
- 2014