Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency band

In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inaccurate peaks for measurements of electrical properties of low-loss samples in the well-known Nicolson-Ross-Weir method. Without using this factor in the expressions and combining better features of the methods available in the literature, the proposed procedure allows highly accurate permittivity measurements over a broad band. We have validated the proposed method by permittivity measurements of a low-loss sample by different methods. © 2014 Taylor & Francis.