1. Field-effect passivation of the SiO2-Si interface
- Author
-
Glunz, S.W., Biro, D., Rein, S., and Warta, W.
- Subjects
Solar cells -- Analysis ,Integrated circuits -- Passivation ,Interface circuits -- Analysis ,Surfaces (Technology) -- Research ,Physics - Abstract
A study was conducted to investigate the influence of corona charges on the surface recombination velocity at the Si-SiO2 interface on both solar cells and lifetime test structures. A dramatic influence was observed in both cases. A new theoretical model was developed to include the effects of potential fluctuations to be able to quantitatively describe both the injection and surface potential dependence of the effective surface recombination velocity at corona charge surfaces.
- Published
- 1999