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Your search keyword '"Spectrum analysis"' showing total 3 results

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Start Over You searched for: Descriptor "Spectrum analysis" Remove constraint Descriptor: "Spectrum analysis" Topic thin films Remove constraint Topic: thin films Publication Year Range Last 10 years Remove constraint Publication Year Range: Last 10 years Journal journal of applied physics Remove constraint Journal: journal of applied physics Publisher american institute of physics Remove constraint Publisher: american institute of physics
3 results on '"Spectrum analysis"'

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1. Deep level defects in β-Ga2O3 pulsed laser deposited thin films and Czochralski-grown bulk single crystals by thermally stimulated techniques.

2. Effects of oxygen partial pressure and annealing on dispersive optical nonlinearity in NiO thin films.

3. Soft X-ray absorption spectroscopy investigations of Bi6FeCoTi3O18 and LaBi5FeCoTi3O18 epitaxial thin films.

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