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Your search keyword '"CRYSTALLINE interfaces"' showing total 1 results
Start Over Descriptor "CRYSTALLINE interfaces" Topic crystallography Topic interfaces (physical sciences) Journal journal of applied crystallography
1 results on '"CRYSTALLINE interfaces"'

1. Direct inversion of interfacial reflectivity data using the Patterson function.

Author

Bataillou, Benoit, Moriceau, Hubert, and Rieutord, François

Subjects
*INTERFACES (Physical sciences), *CRYSTALLINE interfaces, *SILICON, *SILICON oxide, *PHYSICAL sciences, *CRYSTALLOGRAPHY
Abstract

Shows that the interfacial profile between two bonded wafers can be directly determined using X-ray reflectivity without resorting to standard model-fitting of the data. Attempt to solve the phase problem inherent to any structure determination by scattering technique; Use of a known silicon/silicon oxide interface which acts as a phase reference for the reflected signals.

Published
2003
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