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Time redundancy is sometimes an only option for enhancing circuit reliability when the circuit area is severely restricted. In this paper, a time-redundant error-correction scheme, which is particularly suitable for coarse-grained reconfigurable arrays (CGRAs), is proposed. It judges the correctness of the executions by comparing the results of two identical runs. Once a mismatch is found, the second run is terminated immediately to start the third run, under the assumption that the errors tend to persist in many applications, for selecting the correct result in the three runs. The circuit area and reliability of the proposed method is compared with a straightforward implementation of time-redundancy and a selective triple modular redundancy (TMR). A case study on a CGRA revealed that the area of the proposed method is 1% larger than that of the implementation for the selective TMR. The study also shows the proposed scheme is up to 2.6x more reliable than the full-TMR when the persistent error is predominant.

We propose a novel acceleration scheme for Monte Carlo based statistical static timing analysis (MC-SSTA). MC-SSTA, which repeatedly executes ordinary STA using a set of randomly generated gate delay samples, is widely accepted as an accuracy reference. A large number of random samples, however, should be processed to obtain accurate delay distributions, and software implementation of MC-SSTA, therefore, takes an impractically long processing time. In our approach, a generalized hardware module, the STA processing element (STA-PE), is used for the delay evaluation of a logic gate, and netlist-specific information is delivered in the form of instructions from an SRAM. Multiple STA-PEs can be implemented for parallel processing, while a larger netlist can be handled if only a larger SRAM area is available. The proposed scheme is successfully implemented on Altera's Arria II GX EP2AGX125EF35C4 device in which 26 STA-PEs and a 624-port Mersenne Twister-based random number generator run in parallel at a 116MHz clock rate. A speedup of far more than ×10 is achieved compared to conventional methods including GPU implementation

This paper proposes a novel method to determine a priority for applying selective triple modular redundancy (selective TMR) against single event upset (SEU) to achieve cost-effective reliable implementation of application circuits onto coarse-grained reconfigurable architectures (CGRAs). The priority is determined by an estimation of the vulnerability of each node in the data flow graph (DFG) of the application circuit. The estimation is based on a weighted sum of the node parameters which characterize impact of the SEU in the node on the output data. This method does not require time-consuming placement-and-routing processes, as well as extensive fault simulations for various triplicating patterns, which allows us to identify the set of nodes to be triplicated for minimizing the vulnerability under given area constraint at the early stage of design flow. Therefore, the proposed method enables us efficient design space exploration of reliability-oriented CGRAs and their applications.