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The ferroelectric and magnetic properties of Yb([Mn.sub.1-x][Al.sub.x])[O.sub.3] are examined. The Al substitution resulted in reduced super exchange interaction with Yb and Mn as a result of disordering of a [Mn.sup.3+] triangle spin structure.

The contact resonance of cantilever in scanning probe microscopy is used to amplify small piezoelectric response signals and increase the sensitivity of the detection by many orders of magnitudes. The results are very crucial for studying the ferroelectric and electromechanical properties of nanostructures.

The activities in the growth and advanced characterization of nanoscale ferroelectrics are explored. The atomic force microscope (AFM) is used to study the nanoscale ferroelectric domains, leading to the precise analysis of domain wall creep and roughness in Pb(Zr,Ti)[O.sub.3] thin films.

The resistivity and adhesive strength of several multi-layer thin film coatings on z-oriented and AT-oriented single crystal quartz plates are analyzed. Both properties are documented as a function of temperature exposure for the Mo-Au and Cr-Au binary systems and the Cr-Mo-Au and Cr-Ni-Au ternary thin film systems. The Cr-Au films show significant resistivity after thermal annealing. The resistivity of Mo-Au, Au and Al films decrease after thermal annealing under all conditions. Mean adhesive strengths of the Cr-Au, Cr-Mo-Au and Cr-Ni-Au films are excellent.