Higher-order electromechanical response of thin films by contact resonance piezoresponse force microscopy

Authors :: Harnagea, Catalin
Pignolet, Alain
Alexe, Marin
Hesse, Dietrich
Source :: IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. Dec, 2006, Vol. 53 Issue 12, p2309, 14 p.
Publication Year :: 2006
Abstract: The contact resonance of cantilever in scanning probe microscopy is used to amplify small piezoelectric response signals and increase the sensitivity of the detection by many orders of magnitudes. The results are very crucial for studying the ferroelectric and electromechanical properties of nanostructures.

Subjects :: Electromechanical devices -- Analysis
Dielectric films -- Electric properties
Dielectric films -- Magnetic properties
Thin films -- Electric properties
Thin films -- Magnetic properties
Nanotechnology -- Research
Business
Electronics
Electronics and electrical industries

Language :: English
ISSN :: 08853010
Volume :: 53
Issue :: 12
Database :: Gale General OneFile
Journal :: IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
Publication Type :: Academic Journal
Accession number :: edsgcl.156764207

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