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2. A new hardware/software platform and a new 1/E neutron source for soft error studies: testing FPGAs at the ISIS facility

6. Dynamic Test Methods for COTS SRAMs

9. Multiple Cell Upset Classification in Commercial SRAMs

13. A New Hardware/Software Platform and a New lIE Neutron Source for Soft Error Studies: Testing FPGAs. at the ISIS Facility.

25. 2015 Index IEEE Transactions on Nuclear Science Vol. 62.

26. Conference Author Index.

29. Conference Author Index.

43. Conference Author Index.

44. A New Hardware/Software Platform and a New 1/E Neutron Source for Soft Error Studies: Testing FPGAs at the ISIS Facility

45. Conference Author Index.

46. Conference Author Index.

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