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The recipients of the 2023 NSREC Outstanding Conference Paper Award are Ali Jouni, Victor Malherbe, Bastien Mamdy, Thomas Thery, Vincent Correas, Serge De Paoli, Valérian Lalucaa, Cédric Virmontois, Gilles Gasiot, and Vincent Goiffon for their paper titled “Effect of Proton Energy and Bias Conditions During Irradiation on CMOS Single-Photon Avalanche Diodes.”

The IEEE Transactions on Nuclear Science Best Paper Award is an annual award recognizing the most significant paper published in the TRANSACTIONS in a given year. The award is sponsored by the IEEE Nuclear and Plasma Sciences Society and the winning paper is selected according to its quantifiable usefulness to the community. The authors of papers published in the TRANSACTIONS in the third year prior to the year of the award are eligible for consideration. Thus, the 2024 award is awarded to the paper published in calendar year 2021 judged to be the most useful to our community based on metrics calculated for the years 2021, 2022, and 2023.

The recipients of the 2022 NSREC Outstanding Conference Paper Award are Daniel Oliveira, Elizabeth Auden, and Paolo Rech for their article titled “Radiation-Induced Faults Generation and Propagation in Quantum Bits and Quantum Circuits.”

This paper integrates the results of numerous nuclear utility industry meetings with commercial business practices. The Central Procurement Organization (CPO) is designed to achieve an immediate 30%-50% reduction in total procurement, engineering qualification, warehousing, and distribution cost. Three (3) areas define a CPO success criteria: (1) Lean, credible, and cost-effective issues discussed include facility cost, operational cost, staff expertise, product priorities, warehousing, and distribution; (2) Common technical, commercial, and quality requirement issues discussed include current industry practices and proposed future methodologies, and (3) Financial survivability issues which are the most critical since the CPO must exist during changing internal and external utility environments. Areas discussed are financial return criteria, liabilities, and survivability in the competitive marketplace. Alternative implementation of CPO structures, consisting of utility groups, a single utility, and/or partnering with commercial firms, are discussed considering the current industry environment.

This year we do not have a Distinguished Paper Award since a poster paper has been selected as the Outstanding Conference Paper.

The recipients of the 1993 NSREC Outstanding Conference Paper Award are Cheryl Dale of the Navel Research Laboratory, Paul Marshall of SFA, Inc., Brent Cummings and Louis Shamey of Ball Aerospace, and Andrew Holland of the University of Leicester for their paper entitled "Displacement Damage Effects in Mixed Particle Environments for Shielded Spacecraft CCDs." This paper describes new measurements and reviews literature results for particle-induced damage effects on the charge transfer efficiency in state of the-art CCDs, and demonstrates good agreement between the energy dependencies of proton damage and the non-ionizing energy loss (NIEL) for protons in Si. Massive shtelds being considered to preserve CCD performance in satellites were analyzed using the transport code BRYNTRN which quantifies both primary and secondary particle production. Using NIEL to combine the cumulative effects of both protons and neutrons reaching the CCDs, both Al and Ta shield approaches for trapped and flare proton environments were compared. Thick Ta shields were shown to have diminished benefit owing to damage from large secondary neutron fluxes. Shockley-Read-Hall theory was used to illustrate the importance of CCD operating conditions and transfer efficiency measurement techniques evaluating flight performance and comparing results between devices and laboratories. This is a very timely topic due to the large number of space missions now using or planning to use CCDs as a key part of their payload.

The recipients of the 1992 NSREC Outstanding Conference Paper Award are R. E. Stahlbush and G.J. Campisi of the Naval Research Laboratory, J. B. McKitterick and W. P. Maszara of Allied-Signal Aerospace, Peter Roitman of the National Institute of Science and Technology, and G. A. Brown of Texas Instruments Inc. for their paper entitled "Electron and Hole Trapping in Irradiated SIMOX, ZMR and BESOI Buried Oxides." This paper reports a study of shallow electron and deep hole traps in buried oxides formed by SIMOX, ZMR and BESOI, and of thermal oxides with and without a polysilicon cap. Irradiation was performed at cryogenic temperatures, freezing the electrons in shallow traps and immobilizing the holes. Following the irradiation, the electrons are detrapped by either field stressing or by annealing. Once the electrons in the shallow traps are removed, hole motion was observed while annealing to 450 K. By examining a large number of samples with a wide variety of processing conditions, the authors were able to conclude the high temperature processing of an oxide buried under a silicon layer chemically reduces the oxide, and that the defects in the resulting oxygen deficient oxide are responsible for the electron and hole trapping. The shallow electron and deep hole traps are not unique to the buried oxide of SIMOX material. This work must be considered a significant contribution to the understanding of charge trapping in buried oxides.

The recipients of the 1994 NSREC Outstanding Conference Paper Award are Gordon Hopkinson of SIRA Ltd., Isobel Hopkins of SIRA/UCL Postgraduate Centre, and Bengt Johlander of ESA/ESTEC, for their paper entitled, "Proton-Induced Charge Transfer Degradation in CCDs for Near-Room Temperature Applications." The paper describes an innovative optical technique for measuring charge transfer inefficiency in CCDs operated in the near-room-temperature-range of -30°C to 30°C. The optical spot technique enables the measurement of CTD dependence on signal size, background charge, and clock waveform shape, as well as trap emission times, as a function of these variables. The technique involves spot illumination of the CCD, followed by repeated charge transfer regimes. It is applicable to any CCD and yields improved accuracy over the x-ray method. The paper reflects strong current interest in CCD hardness issues as these devices become more pervasive in space applications

The recipients of the Outstanding Conference Paper Award for the 1989 Conference are Nelson S. Saks and Dennis B. Brown, of the Naval Research Laboratory, for their paper entitled "Interface Trap Formation via the Two-Stage H+ Process." In this paper, the interface trap (NiJ formation process in MOSFETs has been studied after pulsed irradiation. Experimental results are then compared with the "two-stage" model wherein the rate-limiting step in the formation process is slow drift of H+ through the oxide. Detailed data are obtained on the time- and oxide field-dependencies of the Nit formation for each of the two stages. The time-dependence of the formation process is found to be strongly dependent on the sign of the first stage oxide field. A model is developed for the production of H+ throughout the oxide, which shows that the initial H+ distributions are triangular functions of position. Calculations based on this model, which incorporate dispersive transport for the H+ drift, are in good agreement with experiment and correctly predict the dependence on first stage field. A second major result of this work is that the magnitude of the Nit formation, as a function of first stage oxide field, is found to have a strong maximum near zero field. This unexpected behavior apparently arises from the oxide field dependence of the H+ formation process. Despite many years of intensive research, the mechanism of interface trap creation by radiation remains highly controvesial. This work must be considered as major new evidence in support of the two-stage hydrogen ion model.

Recipients of the outstanding conference paper award for the 1990 conference were Paul J. McWhorter, Sam L. Miller, and William M. Miller for their paper entitled "Modeling the Anneal of Radiation-Induced Trapped Holes in a Varying Thermal Environment". This work was performed at Sandia's Microelectronics Quality/Reliability Center (MQRC), and demonstrates that the anneal of radiation induced trapped holes is primarily due to two mechanisms; tunneling and thermal emission.

In recent months a number of suggestions have been made to improve the appearance and readability of author-prepared papers appearing in some issues of our journal. Since all contributed papers are now published in a typeset format, it is worthwhile to consider changes to update the preparation of author-prepared papers as well.

The recipients of the Outstanding Paper Award for the 1991 Conference are Jeffrey L. Titus, Gregory H. Johnson, Ronald D. Schrimpf, and Kenneth F. Galloway for their paper entitled "Single-Event Burnout of Power Bipolar Junction Transistors." This paper presents experimental evidence that power bipolar junction transistors are susceptible to catastrophic failure in a cosmic ray environment. Several types of commercially available power transistors were characterized using the tandem Van de Graaff accelerator at Brooknaven National Laboratory. Most device types that were exposed to a mono-energetic ion with an LET greater than 27 Me V-cm 2/mg exhibited burnout at collector-emitter voltages less than their rated breakdown voltage. Failure analysis performed on burned out devices indicates that the failure mechanism is similar to thermal runaway induced by second breakdown. A semi-analytical model was developed to explain this failure mechanism. The model suggests a strong correlation between single-event burnout susceptibility and key layout and processing parameters. The experimental results dictate that system designers should seriously consider the impact of single-event burnout of power bipolar transistors in space applications.

Presents all the Nominees for 1992 Outstanding Conference Paper Award.

Prospective authors must submit 10 copies of a 500 word abstract in English on 81/2" x 11 ", using Pica or Elite 12 type leaving one inch per side on all 4 sides with supporting figures. The heading should include (in capital letters or bold type): Title of paper and names of authors and affiliations. Please include phone and fax numbers of at least the main author.

Presents a list of Nominees for 1990 outstanding conference paper award for this issue.

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INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS to be held in Baltimore, Maryland on June 7-11, 1992

System-level testing of electronics is an affordable method of assessment of the performance of complete electronic systems designed for applications in the radiation environment. Compared to component-level testing, system-level test offers a much smaller degree of observability about the performance of particular system elements. The information received during the irradiation of a system might be therefore not sufficient for the identification of every system under test (SUT) malfunction. As a consequence, no action might be taken to recover the system operation while certain parts of its functionality would be lost due to the radiation-induced effects. This can lead to the incorrect execution of the system-level test and improper conclusions about radiation-induced effects. The present paper demonstrates a method allowing an efficient identification of system-level failures based on the system total current consumption monitoring. The proposed technique can be easily implemented with common instrumentation and at the same time provides valuable feedback on SUT operation. The retrieved current consumption information can be used to identify system failures that may be not observable through the communication channels that are by default included in the tested setup. Furthermore, the posttest analysis can be performed on the collected data to investigate the SUT condition along the complete timeline of its irradiation. The verification of the proposed method was performed during the qualification test of a system designed for applications at the high-energy particle accelerator facility.

Terrestrial neutron-induced single-event gate rupture (SEGR) in a commercial depletion mode gallium nitride (GaN) power high-electron-mobility transistor (HEMT) has been reported in our recent paper. To further understand the neutron-induced failure mechanisms, nuclear event and electronic simulations were performed to model the effect of terrestrial neutron secondary-ion-induced gate dielectric breakdown. Transient device simulations determined ion-induced peak transient electric field and duration for a variety of ion linear energy transfers (LETs), ion injection locations, and applied drain voltages. Results demonstrate that the peak transient electric fields exceed the breakdown strength of the gate dielectric leading to dielectric defect generation and breakdown.

The April 2024 Special Issue of the IEEE Transactions on Nuclear Science (TNS) contains selected papers from the 60th annual IEEE International Nuclear and Space Radiation Effects Conference (NSREC), which was held in Kansas City, MO, USA, from July 24 to 28, 2023. The IEEE NSREC is sponsored by the IEEE Nuclear and Plasma Sciences Society. More than 55 of the papers presented during NSREC are included in this year’s special issue. This issue is not a conference proceeding or a conference record. Papers that appear in this issue have all successfully completed the regular journal review process before the special issue deadline. A few other papers presented during the conference may appear in the subsequent issues of IEEE TNS.

On Behalf of the Committee, I am pleased to announce the 2022 IEEE Nuclear and Space Radiation Effects Conference (NSREC) awards. In a strong field of candidate papers, one paper stood out in terms of relative ranking and scoring, and a second paper received evaluations well above those of the remaining papers. Accordingly, it was decided to award a best paper and a meritorious paper for NSREC 2022. The Outstanding Student Paper was the highest-ranking finalist paper first authored and presented by a student. The Outstanding Data Workshop paper was judged on the basis of the quality and impact of the poster at NSREC. The award recipients include:

The August 2024 special issue of the IEEE Transactions on Nuclear Science (TNS) contains more than 60 peer-reviewed journal articles prepared on the basis of presentations made at the 2023 Conference on Radiation and Its Effects on Components and Systems (RADECS), held in Toulouse, France, September 25–29, 2023. Additional papers presented at RADECS 2023 are available in the conference proceedings, available through IEEE Xplore.

The April 2023 Special Issue of the IEEE Transactions on Nuclear Science (TNS) contains selected papers from the 59th annual IEEE International Nuclear and Space Radiation Effects Conference (NSREC), which after two years of virtual conferences, was held in person from July 18 through July 22, 2022, in Provo, UT, USA. The 2022 IEEE NSREC was sponsored by the IEEE Nuclear and Plasma Sciences Society. More than 40 of the papers presented at NSREC are included in this year’s Special Issue. This issue is neither a conference proceeding nor a conference record. The papers that appear in this issue successfully completed the regular journal review process before the Special Issue deadline. A few other papers presented during the conference are likely to appear in subsequent issues of IEEE TNS.

IEEE Transactions on Nuclear Science (TNS) is pleased to announce that Dr. Jiaru Shi has accepted an appointment as an Associate Editor handling papers on accelerator technology. He will be working alongside Dr. Evegenya Simakov, who will be continuing in her role as an Associate Editor.

An air monitor has been developed at the Oak Ridge Y-12 Plant to sample the air in enriched uranium processing areas and to detect elevated particulate concentrations due to an upset condition. The monitor measures the alpha particle activity from material collected on 47-mm filter paper. Three energy windows are used to allow quantification of background activity from radon and thoron daughters and correction of their spillage into the uranium window. There is sufficient monitor memory to hold a history file of six days' activity from three sampling heads at 20-min status intervals. Alarm signals are activated if the absolute level of activity on a filter exceeds a predefined level, or if an excessively fast rate of buildup is occurring, which would cause the absolute level to be exceeded. This monitor is combined with an absolute particle counter, and data are collected at a processing station where uranium dust is known to be present. The occurrence of high particle count activity in the 3.0-10.0- mu m range is followed by increased alpha activity on the filter paper.<>

This paper presents techniques for overcoming the shortcomings inherent in known methods for imaging three-dimensional γ-ray sources as encountered in nuclear medicine. Conventional pinhole and collimator cameras have low efficiency and do not display depth information. Coded aperture systems have high photon collection efficiencies, but their noise performance is worse than that of conventional apertures for sources of interest. Multiple view systems, with either cone beam or transverse axial geometries, have low efficiencies. This paper presents a general theory for increasing the efficiency of such multiple view systems. Source dependent time-modulated apertures are used. In other words, a particular modulating function is chosen according to the characteristics of the source being imaged. A statistically optimal demodulating method is used. The final image is that of a chosen source plane, without the out-of-focus background produced by other imaging methods.

This paper presents an up-to-date overview of the single-event latchup (SEL) hard failure mode encountered in electronic device applications involving heavy ion environment. This phenomenon is specific to CMOS technology. Single-event latchup is discussed after a short description of the effects induced by the interaction of a heavy ion with silicon. Understanding these effects is necessary to understand the different failures. This paper includes a description of the latchup phenomenon and the different triggering modes, reviews of models and hardening solutions, and finally presents new developments in simulation approaches.

Stopping powers have been measured for all ions of 6

Successful understanding of the plasma behavior in the large tokamaks now in design or under construction will require more complex diagnostics than and, for some parameters, different diagnostics from those presently in use. This paper describes the significantly new aspects of these tokamaks for the plasma diagnostic physicist. It then discusses in more detail specific diagnostic developments that are required drawing on current operational experience. The paper concentrates on diagnostic techniques which are clearly of interest at a conference on small accelerators either through accelerator requirements, relevance to their own measurement techniques or their capability for providing development or calibration services.

One of the critical performance parameters for a Compton camera imager is the point source location accuracy. This paper describes analysis of both experimental and simulated data to evaluate the point source resolving power of a germanium Compton camera imager. The experimental data are taken from a set of experiments performed in 1993 at Naval Research Laboratory. Subsequent design studies have utilized Monte Carlo simulations to predict the performance parameters for a number of detector geometries. Presented in this paper are the results from one of those configurations.

This index covers all technical items - papers, correspondence, reviews, etc. - that appeared in this periodical during the year, and items from previous years that were commented upon or corrected in this year. Departments and other items may also be covered if they have been judged to have archival value. The Author Index contains the primary entry for each item, listed under the first author's name. The primary entry includes the co-authors' names, the title of the paper or other item, and its location, specified by the publication abbreviation, year, month, and inclusive pagination. The Subject Index contains entries describing the item under all appropriate subject headings, plus the first author's name, the publication abbreviation, month, and year, and inclusive pages. Note that the item title is found only under the primary entry in the Author Index.

This index covers all technical items - papers, correspondence, reviews, etc. - that appeared in this periodical during the year, and items from previous years that were commented upon or corrected in this year. Departments and other items may also be covered if they have been judged to have archival value. The Author Index contains the primary entry for each item, listed under the first author's name. The primary entry includes the co-authors' names, the title of the paper or other item, and its location, specified by the publication abbreviation, year, month, and inclusive pagination. The Subject Index contains entries describing the item under all appropriate subject headings, plus the first author's name, the publication abbreviation, month, and year, and inclusive pages. Note that the item title is found only under the primary entry in the Author Index.

The 28th IEEE International Nuclear and Space Radiation Effects Conference (NSREC) and Short Course was held in San Diego, California from July 15, 1991 through July 19, 1991 at the Town and Country Hotel and Convention Center. The 1991 IEEE NSREC was sponsored by the IEEE/NPSS Radiation Effects Committee and co-sponsored by the Defense Nuclear Agency, Sandia National Laboratories and the Jet Propulsion Laboratory. The Conference was attended by 605 engineers, scientists, civilian and military space program managers, and other interested parties from countries throughout the world. An excellent technical program was presented that included a short course, three invited papers, 51 contributed oral presentations, 37 poster papers and 9 late news papers. An important new addition in 1991 was a two day Industrial Exhibit consisting of booths from 18 companies.

The August 2023 Special Issue of IEEE Transactions on Nuclear Science (TNS) contains approximately 70 peer-reviewed journal articles prepared on the basis of presentations made at the 2022 Conference on Radiation and Its Effects on Components and Systems (RADECS) held in Venice, Italy, October 3–7, 2022. Additional papers presented at RADECS 2022 are available in the conference proceedings, available through IEEE Xplore.

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

These instructions give guidelines for preparing papers for this publication. Presents information for authors publishing in this journal.

This conference issue presents 44 papers, which have been accepted so far after a thorough peer review process supported by a large number of reviewers and coordinated by eight Editors, to whom we owe a debt of thanks. These contributions come from a very broad range of fields of application, including astrophysics, medical imaging, nuclear and plasma physics, particle accelerators, and particle physics experiments.

In a paper presented at the 1977 Particle Accelerator Conference, R. Faulkner and R. Cooper outlined the design of the LAMPF Line D Fast Kicker System. At that time the prototype had been constructed and initial tests were complete. After the Kicker was reassembled in final operating configuration, some components were extensively modified, and considerable operational experience has since been obtained. The system has now operated in production for over 500 hours. The modifications made to the original design were few but important in terms of reaching the system design objectives. Much of the continuing component development program has centered on upgrading reliability at sustained high average power levels. The Kicker is presently capable of delivering 7-¿s-long pulses at a 120-Hz repetition rate with a peak current of 5800 A. It has operated for complete LAMPF prodtuction cycles without maintenance. Continued development work has concentrated on the high power load resistor, the pulse forming network (PFN) capacitor bank, the charging inductor, and the elimination of component failure caused by high voltage/current discharges. This paper discusses Kicker problem areas and solutions.

In a previous paper, calculated results based on a one-dimensional ballistic model were presented to indicate the extent to which a current pulse of 150-keV electrons containing 1 ¿C of charge and having a duration of 15 nsec (FWHM) could be bunched by a combination of accelerating and decelerating voltage gaps followed by a drift space. In the present paper a very approximate perturbation model is used to determine the extent to which the prebuncher performance determined previously is modified by radial electron motion. It is found that if a longitudinal magnetic field of 1 kG is applied in the region containing the voltage gaps and if a sufficiently strong longitudinal magnetic field (~ 3 kG) is applied in the drift space the prebuncher performance determined here is essentially the same as that shown in the previous paper.

The ISA beam abort (extraction) system must be highly efficient, in the sense of producing minimum beam loss, and reliable to prevent serious damage to accelerator components by the circulating high-energy beams. Since the stored beams will be debunched, the low-loss requirement can be met only with ultra-thin extraction septa and/or fast-acting kickers. This paper examines the design of the ISA extraction kickers subject to a set of extraction channel constraints and a given maximum working voltage. Expressions are derived for determining system parameters for both a lumped parameter magnet and a delay-line magnet. Using these relationships, design parameters are worked out for several possible system configurations. The paper also describes the construction of a full-scale prototype module of the kicker and summarizes the preliminary test results obtained with the module.

This paper presents the point reference design of a heavy ion driver which results from a parametric scaling model of a commercial ICF power plant. The power plant consists of the driver, the reactor, the pellet factory, and the balance of plant which generates and distributes the electric power to sell as well as the power to run the driver. The results presented in this paper deal with the driver and its interface to the reactor. These results are obtained with a heavy ion driver model which is part of a larger model developed by the Westinghouse Electric Corporation for the entire power stations. The theoretical model which has been developed for the heavy ion driver attempts to set forth a self consistent set of equations that define an envelope within which real drivers must fall. Many technically critical parts of a driver have been intentionally left out where it was felt that they did not impact the basic conceptual design, system size, or cost. Detailed discussions of all of the subsystems can be found in the proceedings of the Heavy Ion Fusion Workshops and the IEEE Biannual Accelerator Conferences. The scaling of costs is based on the base costs for Fermilab and the AGS at BNL given in the Proceedings of the Heavy Ion Fusion Workshop of October 17-21, 1977, pages 141-145. The power supply costs are based on a recent quote by Continental to ANL for a 5 MW unit delivered, but not installed, of $.20/watt peak.

Through the past few decades, a great deal of sophistication has evolved in the numeric codes used to evaluate electromagnetically resonant structures. The numeric methods are extremely precise, even for complicated geometries, whereas analytic methods require a simple uniform geometry and a simple, known mode configuration if the same precision is to be obtained. The code SUPERFISH, which is near the present state of the art of numeric methods, does have the following limitations: No circumferential geometry variations are permissible; there are no provisions for magnetic or dielectric losses; and finally, it is impractical (because of the complexity of the code) to modify it to extract particular bits of data one might want that are not provided by the code as written. This paper describes how SUPERFISH was used as an aid in derivating an analytic model of the LAMPF II Booster Cavity. Once a satisfactory model was derived, simple FORTRAN codes were generated to provide whatever data was required. The analytic model is made up of TEM- and radial-mode transmission-line sections, as well as lumped elements where appropriate. Radial transmission-line equations, which include losses, were not found in any literature, and the extension of the lossless equations1 to include magnetic and dielectric losses are included in this paper.

The Experimental Test Accelerator (ETA) is designed to produce a 10 kAmp electron beam at an energy of 4.5 MeV in 40 nsec pulses at an average rate of 2 pps. The accelerator also operates in bursts of 5 pulses spaced by as little as one millisec at an average rate of 5 pps. The machine is currently operating near 80% of its design values and has accumulated over 2.5 million pulses--mostly at a rate of one pps. Our previous paper described the ETA injector and its associated pulse power system. This paper discusses the plasma cathode electron source, the remainder of the accelerator, and the operating characteristics of the machine.

A previous paper has presented to calculate not only the fundamental and longitudical modes but also the transverse higher modes of RF cavity. But with this method higher modes are calculated one by one. In this paper we present a finite element method using triangulated elements, six points quadratic interpolation for improvement. At first, we obtain a tridiagonal coefficient matrix with the Householder method, then calculate its eigenvalues using half-divided method. With this method we can calculate any order eigenvalues(and resonant frequency values) and the responding eigenvectors (and field distribution) of a mode group simultaneously at one time. This method is convenient, accurate and economical for computing time.

These instructions give guidelines for preparing papers for this publication. Presents information for authors publishing in this journal.

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

It has been previously shown that small-signal microwave transistors are sensitive to ionizing radiation and that this can lead to application limitations . This paper extends the work to a wider range of currently used transistor types and amplifiers with applications ranging from low noise front-end to class C power output amplifiers. Two types of hEE degradation have been identified viz. "permanent and room-rtemperature current dependent "recoverable". Both types of degradation have been found throughout the range of transistor types and it is shown that they can also be simulated by avalanching the emitter-base junctions. Class A amplifier performance of all power levels can be directly affected by either type of degradation and a detailed example is given in the more complex case of "recoverable" characteristics. Class C amplifiers are not directly affected by cumulative ionizing radiation doses of up to 1 Mrad (Si) or emitter-base avalanche although significant transistor hEE degradation can occur in both cases. One example of microwave performance degradation in a Class B/C amplifier is described to illustrate the only known exception to this rule.