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This paper introduces a new metric to characterize test sets in terms of their diagnostic power. Our method uses much less space compared to the existing ones and is quite accurate. The metric can be utilized to increase the diagnosability of incompletely specified test sets via don't care filling. The X-filling approach can be integrated with test pattern generation tools to aid in better diagnostic pattern set generation. [ABSTRACT FROM PUBLISHER]

With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. In this paper, we analyze the multiple-delay-fault diagnosis problem and propose a novel approach to solve it. We enhance the diagnostic resolution by processing failure logs at various slower-than-nominal clock frequencies. We evaluate the utility of n-detection and timing-aware automatic-test-pattern-generated (ATPG) sets. Experimental results show that using timing-aware ATPG sets yields better diagnostic resolution and results in better delay-defect-size estimations compared to n-detection ATPG sets. We experimentally determined our diagnosis algorithm's sensitivity to delay variations. [ABSTRACT FROM AUTHOR]