1. In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale
- Author
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Aliaksandr Darahanau, Barry C. Muddle, Andrei Y. Nikulin, Osami Sakata, Alexei Y. Souvorov, and Ruben A. Dilanian
- Subjects
Physics ,business.industry ,Synchrotron radiation ,Refractive index profile ,Fraunhofer diffraction ,Synchrotron ,law.invention ,Characterization (materials science) ,symbols.namesake ,Optics ,law ,X-ray crystallography ,symbols ,Angular resolution ,Composite material ,business ,Refractive index - Abstract
High-angular-resolution Fraunhofer diffraction data were collected from several samples with interfaces between dissimilar metals and an artificial crack in a metal foil using synchrotron x-radiation. The refractive index profile in the vicinity of the interface and crack of each sample was reconstructed with spatial resolution of about 40-60 nm by the Phase Retrieval X-Ray Diffractometry technique, using only limited a priori knowledge of the sample. These studies have demonstrated the viability of the technique as an in-situ nondestructive method of characterization of internal interfaces within multiphase materials and crack developing under external force.
- Published
- 2008