In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale

High-angular-resolution Fraunhofer diffraction data were collected from several samples with interfaces between dissimilar metals and an artificial crack in a metal foil using synchrotron x-radiation. The refractive index profile in the vicinity of the interface and crack of each sample was reconstructed with spatial resolution of about 40-60 nm by the Phase Retrieval X-Ray Diffractometry technique, using only limited a priori knowledge of the sample. These studies have demonstrated the viability of the technique as an in-situ nondestructive method of characterization of internal interfaces within multiphase materials and crack developing under external force.