8 results on '"Huang, Y.H"'
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2. Roughness development in the depth profiling with 500 eV O 2+ beam with the combination of oxygen flooding and sample rotation
3. Long-term reproducibility of relative sensitivity factors obtained with CAMECA Wf
4. High-temperature stability of Au/Pd/Cu and Au/Pd(P)/Cu surface finishes
5. Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ technique
6. Roughness development in the depth profiling with 500eV O2+ beam with the combination of oxygen flooding and sample rotation
7. Roughness development in the depth profiling with 500eV O2 + beam with the combination of oxygen flooding and sample rotation
8. Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2 + technique
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