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Multiple perfect transmissions of electromagnetic waves are found in the photonic band gap of the symmetric dielectric heterostructures (SDH) constructed as (AB)nBm(BA)n, where A and B stand for different dielectric materials, and m and n are the repeating numbers of the units. The photonic frequency and the mode number of resonant transmissions therein can be manipulated by varying m, and the quality factor Q of the perfect transmission peak increases exponentially with increasing n. These features are experimentally demonstrated in a SDH of TiO2/SiO2 for visible and near infrared light. The possible applications of SDH for the wavelength division multiplexing system are discussed. [ABSTRACT FROM AUTHOR]

Examines the characteristics of KTiOAsO4 (KTA) crystals from tungstate fluxes. Analysis of the anomalous scattering and ferroelectric domain of KTA; Mechanism of domain inversion via two-fold-axis in terms of the structural characteristics of KTA; Use of etching and multiple-crystal x-ray topography to investigate the domain-inverted grating of KTA.

Examines the contrast reversal of antiparallel domains in copper-doped crystals. Use of synchrotron topography; Presence of ferroelectric x-ray anomalous-scattering effect at the wavelength; Polarity of the domain walls; Formation of domain walls to compensate the charges from the inhomogeneous distributions of metal atoms in the bulk crystals.

Examines the ferroelastic phase transition in erbium-doped lanthanum pentaphosphate crystals with synchrotron radiation. Characteristics of a classical second-order transition on topographs; Fluctuations of the domain wall numbers with temperature; Link of the domain wall fluctuation with order parameter critical function.

Investigates synchrotron topography used in the characterization of Fe-doped flux-grown KTN with composition on the margin of paraelectric phase. Appearance of growth bands in flux-grown KTN; Impact of the occurrence of the partial transition on the interior of KTN crystals; Analysis on the occurrence and growth characteristics of KTN.

Examines the fabrication of quasiperiodic tantalum/aluminum multilayer films by magnetron sputtering. Structure characterization of the multilayered films; Use of x-ray diffraction technique; Application of Fibonacci films as optical elements.