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White-beam synchrotron topographic characterization of flux-grown KTiOAsO4.

Authors :
Liu, W.J.
Jiang, S.S.
Source :
Applied Physics Letters. 1/1/1996, Vol. 68 Issue 1, p25. 3p. 5 Black and White Photographs, 1 Diagram.
Publication Year :
1996

Abstract

Examines the characteristics of KTiOAsO4 (KTA) crystals from tungstate fluxes. Analysis of the anomalous scattering and ferroelectric domain of KTA; Mechanism of domain inversion via two-fold-axis in terms of the structural characteristics of KTA; Use of etching and multiple-crystal x-ray topography to investigate the domain-inverted grating of KTA.

Details

Language :
English
ISSN :
00036951
Volume :
68
Issue :
1
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4177964
Full Text :
https://doi.org/10.1063/1.116744